Grain Boundary Diffusion in Recrystallizing Nanocrystalline Materials
2009 ◽
Vol 289-292
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pp. 641-648
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Keyword(s):
A model that considers diffusion in nanocrystalline materials undergoing recrystallization was developed. Application of this model enabled us deriving 63Ni radiotracer diffusion coefficients along the grain boundaries in ultrafine grain copper produced by equal channel angular pressing from the experimentally measured radiotracer penetration profiles.
2008 ◽
Vol 584-586
◽
pp. 380-386
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2008 ◽
Vol 56
(19)
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pp. 5500-5513
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2018 ◽
Vol 383
◽
pp. 96-102
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2013 ◽
Vol 114
(12)
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pp. 1045-1052
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2011 ◽
Vol 312-315
◽
pp. 1116-1125
2005 ◽
Vol 237-240
◽
pp. 1043-1048
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