Determination of Stoichiometry and Oxygen Content in Platelike and Octahedral Oxygen Precipitates in Silicon with FT-IR Spectroscopy

1997 ◽  
Vol 258-263 ◽  
pp. 405-410 ◽  
Author(s):  
Olivier De Gryse ◽  
Paul Clauws ◽  
Jan Vanhellemont ◽  
Cor Claeys
1982 ◽  
Vol 36 (2) ◽  
pp. 155-157 ◽  
Author(s):  
D. B. Chase ◽  
R. L. Amey ◽  
W. G. Holtje

Diffuse reflectance FT-IR spectroscopy is used to obtain infrared spectra of paints directly on paper panels. The binder contribution to the spectrum can be effectively eliminated by spectral subtraction and the spectra of photodecomposition products are obtained. Comparison with reference spectra allows the determination of the photodecomposition mechanism.


1989 ◽  
Vol 35 (9) ◽  
pp. 1854-1856 ◽  
Author(s):  
J D Kruse-Jarres ◽  
G Janatsch ◽  
U Gless

2006 ◽  
Vol 54 (26) ◽  
pp. 10300-10306 ◽  
Author(s):  
Anand Subramanian ◽  
Juhee Ahn ◽  
V. M. Balasubramaniam ◽  
Luis Rodriguez-Saona

1995 ◽  
Vol 372 (2-3) ◽  
pp. 241-247 ◽  
Author(s):  
Ye Fang ◽  
Chunli Bai ◽  
Ying Wei ◽  
Youqi Tang ◽  
Shwu-Bin Lin ◽  
...  

1986 ◽  
Vol 40 (7) ◽  
pp. 1068-1069 ◽  
Author(s):  
M. S. Akhter ◽  
A. R. Chughtai ◽  
D. M. Smith

2001 ◽  
Vol 14 (9) ◽  
pp. 1107-1111 ◽  
Author(s):  
M.A. Legodi ◽  
D. de Waal ◽  
J.H. Potgieter ◽  
S.S. Potgieter

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