Nanometer-Scale Investigation of Schottky Contacts and Conduction Band Structure on 4H-, 6H- and 15R-SiC Using Ballistic Electron Emission Microscopy

Materials Science Forum ◽

10.4028/www.scientific.net/msf.264-268.813 ◽

1998 ◽

Vol 264-268 ◽

pp. 813-816 ◽

Author(s):

Hyoung Jin Im ◽

B. Kaczer ◽

J.P. Pelz ◽

Jin Ming Chen ◽

Wolfgang J. Choyke

Keyword(s):

Band Structure ◽

Conduction Band ◽

Electron Emission ◽

Schottky Contacts ◽

Nanometer Scale ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

Download Full-text

Direct observation of conduction-band structure of4H- and6H−SiCusing ballistic electron emission microscopy

Physical Review B ◽

10.1103/physrevb.57.4027 ◽

1998 ◽

Vol 57 (7) ◽

pp. 4027-4032 ◽

Author(s):

B. Kaczer ◽

H.-J. Im ◽

J. P. Pelz ◽

J. Chen ◽

W. J. Choyke

Keyword(s):

Band Structure ◽

Conduction Band ◽

Direct Observation ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

Download Full-text

Ballistic Electron Emission Microscopy onCoSi2/Si(111)Interfaces: Band Structure Induced Atomic-Scale Resolution and Role of Localized Surface States

Physical Review Letters ◽

10.1103/physrevlett.81.4963 ◽

1998 ◽

Vol 81 (22) ◽

pp. 4963-4966 ◽

Author(s):

K. Reuter ◽

F. J. Garcia-Vidal ◽

P. L. de Andres ◽

F. Flores ◽

K. Heinz

Keyword(s):

Band Structure ◽

Electron Emission ◽

Surface States ◽

Atomic Scale ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

Download Full-text

Ballistic electron emission microscopy study of Schottky contacts on 6H- and 4H-SiC

Applied Physics Letters ◽

10.1063/1.120910 ◽

1998 ◽

Vol 72 (7) ◽

pp. 839-841 ◽

Author(s):

H.-J. Im ◽

B. Kaczer ◽

J. P. Pelz ◽

W. J. Choyke

Keyword(s):

Electron Emission ◽

Microscopy Study ◽

Schottky Contacts ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

Download Full-text

Nanometer-scale investigation of metal-SiC interfaces using ballistic electron emission microscopy

Journal of Electronic Materials ◽

10.1007/s11664-998-0413-8 ◽

1998 ◽

Vol 27 (4) ◽

pp. 345-352 ◽

Author(s):

H. J. Im ◽

B. Kaczer ◽

J. P. Pelz ◽

S. Limpijumnong ◽

W. R. L. Lambrecht ◽

...

Keyword(s):

Electron Emission ◽

Nanometer Scale ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

Download Full-text

Conduction band energies and hot-electron transport characteristics of epitaxial Sc2O3∕Si (111) studied by ballistic electron emission microscopy and internal photoemission

Applied Physics Letters ◽

10.1063/1.2757150 ◽

2007 ◽

Vol 91 (4) ◽

pp. 042901 ◽

Author(s):

W. Cai ◽

S. E. Stone ◽

J. P. Pelz ◽

L. F. Edge ◽

D. G. Schlom

Keyword(s):

Electron Transport ◽

Conduction Band ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Internal Photoemission ◽

Ballistic Electron ◽

Emission Microscopy ◽

Hot Electron Transport

Download Full-text

Ballistic Electron Emission Microscopy and Spectroscopy Study of Ordering-Induced Band Structure Effects in Ga0.52In0.48P

Spontaneous Ordering in Semiconductor Alloys ◽

10.1007/978-1-4615-0631-7_9 ◽

2002 ◽

pp. 257-271

Author(s):

M. Kozhevnikov ◽

V. Narayanamurti

Keyword(s):

Band Structure ◽

Electron Emission ◽

Spectroscopy Study ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

Download Full-text

Measurements of the quantum-confined conduction band energy in the wetting layer surrounding individualIn0.4Ga0.6Asquantum dots by cross-sectional ballistic electron emission microscopy

Physical Review B ◽

10.1103/physrevb.82.035304 ◽

2010 ◽

Vol 82 (3) ◽

Author(s):

C. Marginean ◽

J. P. Pelz ◽

S. Y. Lehman ◽

J. G. Cederberg

Keyword(s):

Conduction Band ◽

Electron Emission ◽

Wetting Layer ◽

Ballistic Electron Emission Microscopy ◽

Cross Sectional ◽

Band Energy ◽

Ballistic Electron ◽

Emission Microscopy ◽

Quantum Confined

Download Full-text

The origin of the integral barrier height in inhomogeneous Au/Co/GaAs67P33-Schottky contacts: A ballistic electron emission microscopy study

Journal of Applied Physics ◽

10.1063/1.366691 ◽

1998 ◽

Vol 83 (1) ◽

pp. 358-365 ◽

Author(s):

Alexander Olbrich ◽

Johann Vancea ◽

Franz Kreupl ◽

Horst Hoffmann

Keyword(s):

Barrier Height ◽

Electron Emission ◽

Microscopy Study ◽

Schottky Contacts ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

Download Full-text

Spatial resolution of ballistic electron emission microscopy measured on metal/quantum-well Schottky contacts

Applied Physics Letters ◽

10.1063/1.2120899 ◽

2005 ◽

Vol 87 (18) ◽

pp. 182105 ◽

Author(s):

C. Tivarus ◽

J. P. Pelz ◽

M. K. Hudait ◽

S. A. Ringel

Keyword(s):

Quantum Well ◽

Spatial Resolution ◽

Electron Emission ◽

Schottky Contacts ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

Download Full-text

Ordering-induced band structure effects in GaInP2 studied by ballistic electron emission microscopy

Applied Physics Letters ◽

10.1063/1.124618 ◽

1999 ◽

Vol 75 (8) ◽

pp. 1128-1130 ◽

Author(s):

M. Kozhevnikov ◽

V. Narayanamurti ◽

A. Mascarenhas ◽

Y. Zhang ◽

J. M. Olson ◽

...

Keyword(s):

Band Structure ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

Download Full-text