Conduction band energies and hot-electron transport characteristics of epitaxial Sc2O3∕Si (111) studied by ballistic electron emission microscopy and internal photoemission

Applied Physics Letters ◽

10.1063/1.2757150 ◽

2007 ◽

Vol 91 (4) ◽

pp. 042901 ◽

Author(s):

W. Cai ◽

S. E. Stone ◽

J. P. Pelz ◽

L. F. Edge ◽

D. G. Schlom

Keyword(s):

Electron Transport ◽

Conduction Band ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Internal Photoemission ◽

Ballistic Electron ◽

Emission Microscopy ◽

Hot Electron Transport

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Measuring spin dependent hot electron transport through a metal-semiconductor interface using spin-polarized ballistic electron emission microscopy

Physical Review B ◽

10.1103/physrevb.76.195311 ◽

2007 ◽

Vol 76 (19) ◽

Author(s):

A. J. Stollenwerk ◽

M. R. Krause ◽

J. J. Garramone ◽

E. J. Spadafora ◽

V. P. LaBella

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Semiconductor Interface ◽

Ballistic Electron ◽

Spin Polarized ◽

Emission Microscopy ◽

Hot Electron Transport

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Hot electron transport studies of the Cu/Si(001) interface using ballistic electron emission microscopy

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ◽

10.1116/1.3136761 ◽

2009 ◽

Vol 27 (4) ◽

pp. 2044 ◽

Author(s):

J. J. Garramone ◽

J. R. Abel ◽

I. L. Sitnitsky ◽

R. L. Moore ◽

V. P. LaBella

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Transport Studies ◽

Emission Microscopy ◽

Hot Electron Transport

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Hot-electron transport processes in ballistic-electron emission microscopy at Au–Si interfaces

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/s0368-2048(00)00118-3 ◽

2000 ◽

Vol 109 (1-2) ◽

pp. 211-222 ◽

Author(s):

M. Dähne-Prietsch ◽

T. Kalka

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Transport Processes ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy ◽

Hot Electron Transport

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Hot-electron transport through Au/GaAs and Au/GaAs/AlAs heterojunction interfaces: Ballistic-electron-emission-microscopy measurement and Monte Carlo simulation

Physical Review B ◽

10.1103/physrevb.53.4845 ◽

1996 ◽

Vol 53 (8) ◽

pp. 4845-4849 ◽

Author(s):

Mao-long Ke ◽

D. I. Westwood ◽

C. C. Matthai ◽

B. E. Richardson ◽

R. H. Williams

Keyword(s):

Monte Carlo Simulation ◽

Monte Carlo ◽

Electron Transport ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Microscopy Measurement ◽

Emission Microscopy ◽

Hot Electron Transport

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Hot-electron transport studies of the Ag/Si(001) interface using ballistic electron emission microscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.3397795 ◽

2010 ◽

Vol 28 (4) ◽

pp. 643-646 ◽

Author(s):

J. J. Garramone ◽

J. R. Abel ◽

I. L. Sitnitsky ◽

V. P. LaBella

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Transport Studies ◽

Emission Microscopy ◽

Hot Electron Transport

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Ballistic electron emission microscopy: from electron transport physics to nanoscale materials science

10.1117/12.183190 ◽

1993 ◽

Author(s):

Hans D. Hallen

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Materials Science ◽

Nanoscale Materials ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Hot-electron scattering at Schottky interfaces measured by temperature dependent ballistic electron emission microscopy

Applied Surface Science ◽

10.1016/s0169-4332(96)00215-2 ◽

1996 ◽

Vol 104-105 ◽

pp. 274-281 ◽

Author(s):

C.A. Ventrice ◽

V.P. LaBella ◽

G. Ramaswamy ◽

H.-P. Yu ◽

L.J. Schowalter

Keyword(s):

Electron Scattering ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Temperature Dependent ◽

Ballistic Electron ◽

Emission Microscopy

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L-valley electron transport in GaAs-AlAs double-barrier resonant tunneling structures studied by ballistic electron emission microscopy

Physical Review B ◽

10.1103/physrevb.66.033309 ◽

2002 ◽

Vol 66 (3) ◽

Author(s):

D. Rakoczy ◽

G. Strasser ◽

C. Strahberger ◽

J. Smoliner

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Resonant Tunneling ◽

Ballistic Electron Emission Microscopy ◽

Double Barrier ◽

Ballistic Electron ◽

Emission Microscopy ◽

Double Barrier Resonant Tunneling

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Direct observation of conduction-band structure of4H- and6H−SiCusing ballistic electron emission microscopy

Physical Review B ◽

10.1103/physrevb.57.4027 ◽

1998 ◽

Vol 57 (7) ◽

pp. 4027-4032 ◽

Author(s):

B. Kaczer ◽

H.-J. Im ◽

J. P. Pelz ◽

J. Chen ◽

W. J. Choyke

Keyword(s):

Band Structure ◽

Conduction Band ◽

Direct Observation ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Hot-electron effects and oxide degradation in MOS structures studied with ballistic electron emission microscopy

IBM Journal of Research and Development ◽

10.1147/rd.444.0517 ◽

2000 ◽

Vol 44 (4) ◽

pp. 517-534 ◽

Author(s):

R. Ludeke

Keyword(s):

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Oxide Degradation ◽

Emission Microscopy ◽

Mos Structures ◽

Electron Effects

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