Microstructure and Residual Stress in T40 Titanium after Tensile Test

2017 ◽  
Vol 905 ◽  
pp. 17-24 ◽  
Author(s):  
Sebastian Wroński ◽  
Krzysztof Wierzbanowski ◽  
Mariusz Jędrychowski ◽  
Jacek Tarasiuk ◽  
Marcin Wronski ◽  
...  
Keyword(s):  
Residual Stress ◽  
Tensile Test ◽  
Rolling Direction ◽  
Domain Size ◽  
Deformation Mechanisms ◽  
Test Material ◽  
Coherent Domain Size ◽  
Material Characteristics ◽  
Average Grain Size ◽  
Coherent Domain

The goal work of this work is to describe the qualitative and quantitative behaviour of titanium T40 during tensile test. Material characteristics were determined using EBSD and X-ray techniques. Textures, twin boundary fractions, residual stresses and coherent domain size were determined. It was found that deformation mechanisms and microstructure characteristics are different in the samples stretched along rolling and transverse directions. For example the average grain size, as determined from EBSD measurements, is higher in the sample stretched along rolling direction. Also smaller coherent domains form and residual stress is more easily relaxed in this sample. A strong appearance of tensile twins was observed in the samples deformed along transverse direction. In the present paper a complex study of material characteristics and deformation mechanisms is presented. A special emphasis is done on residual stress characteristics determined in the samples stretched in two perpendicular directions.

Distribution of Dislocation Density in Tubes from Zr-Based Alloys by X-Ray Data

2005 ◽  
Vol 105 ◽  
pp. 89-94 ◽  
Author(s):  
Margarita Isaenkova ◽  
Yuriy Perlovich
Keyword(s):  
Dislocation Density ◽  
Domain Size ◽  
Ray Method ◽  
Coherent Domain Size ◽  
Texture Measurement ◽  
Burgers Vector ◽  
X Ray ◽  
Pole Figures ◽  
Coherent Domain

As applied to tubes from Zr-based alloys, the X-ray method was developed to determine the dislocation density distribution in a-Zr depending on the orientation of Burgers vector. The method consists in registration of X-ray line profiles by each successive position of the sample in the course of diffractometric texture measurement using reflections of two orders, the following determination of coherent domain size and lattice distortion by means of the Warren-Averbach method for each orientation of reflecting planes, separate calculation of the density of c- and a-dislocations with all possible orientations of Burgers vector and presentation of results in generalized pole figures. Obtained data testify that the dislocation density varies within very wide intervals of several orders of magnitude depending on the grain orientation both in as-rolled and annealed tubes. Features of the constructed dislocation distributions are closely related to the crystallographic texture of studied tubes.

scholarly journals Superconducting properties of very high quality NbN thin films grown by pulsed laser deposition

2019 ◽  
Vol 70 (7) ◽  
pp. 89-94
Author(s):  
Serhii Volkov ◽  
Maros Gregor ◽  
Tomas Roch ◽  
Leonid Satrapinskyy ◽  
Branislav Grančič ◽  
...  
Keyword(s):  
Thin Films ◽  
Transition Temperature ◽  
Superconducting Transition Temperature ◽  
Pulsed Laser ◽  
Domain Size ◽  
Superconducting Transition ◽  
Superconducting Properties ◽  
Si Substrate ◽  
Coherent Domain Size ◽  
Coherent Domain

Abstract In this work, we study the effect of the various substrates on the growth and superconducting properties of NbN thin films grown by using pulsed laser ablation in a N2 + 1%H2 atmosphere on MgO, Al2O3 and Si substrates. Structural and superconducting analyses of the films demonstrate that using MgO and Al2O3 substrates can significantly improve the film properties compared to Si substrate. The X-ray diffraction data indicate that MgO and Al2O3 substrates produce highly oriented superconducting NbN films with large coherent domain size in the out-of plane direction on the order of layer thickness and with a superconducting transition temperature of 13.1 K and 15.2 K, respectively. On the other hand, the NbN film grown on the Si substrate exhibits random polycrystalline orientation. Together with the smallest coherent domain size it leads to the lower critical temperature of 8.3 K. Finally, by using a passivation surface layer we are able to improve superconducting properties of NbN thin film and we observe superconducting transition temperature 16.6 K, the one of the highest value reported so far for 50 nm thick NbN film on sapphire.

Inhomogeneous Distribution of Dislocation Density as Manifestation of Multiscale Structure in Tubes from Zr - Based Alloys

2003 ◽  
Vol 779 ◽  
Author(s):  
Yuriy Perlovich ◽  
Margarita Isaenkova
Keyword(s):  
Dislocation Density ◽  
Domain Size ◽  
Nuclear Industry ◽  
Ray Method ◽  
Coherent Domain Size ◽  
Texture Measurement ◽  
Burgers Vector ◽  
X Ray ◽  
Pole Figures ◽  
Coherent Domain

AbstractAn X-ray method was developed to determine the dislocation density in metal materials as a distribution depending on the orientation of Burgers vector. The method includes registration of X-ray line profiles by each successive position of the sample in the course of diffractometric texture measurement using reflections of two orders, the following determination of coherent domain size and lattice distortion by means of the Warren-Averbach method for each orientation of reflecting planes, separate calculation of the density of c- and a-dislocations with all possible orientations of Burgers vector and presentation of results in the generalized pole figures. The method was used to determine the dislocation density in tubes of Zr-based alloys for nuclear industry. Obtained data show, that the dislocation density varies within very wide interval of several orders of magnitude depending on the grain orientation both in as-rolled and annealed tubes. Features of the dislocation distribution in tubes are closely related to their crystallographic texture.

Warren-Averbach Analysis of Coherent Domain Size in PbZr0.2Ti0.8O3 Thin Films

2008 ◽  
Vol 52 (3) ◽  
pp. 627-630
Author(s):  
D. Y. Kwon ◽  
X. D. Zhang ◽  
Bog G. Kim
Keyword(s):  
Thin Films ◽  
Domain Size ◽  
Coherent Domain Size ◽  
Coherent Domain

The Effect of Coherent Domain Size on the Insertion Activity of Nanocrystalline RuO[sub 2]

2005 ◽  
Vol 152 (8) ◽  
pp. A1613 ◽  
Author(s):  
Jakub Jirkovský ◽  
Marina Makarova ◽  
Petr Krtil
Keyword(s):  
Domain Size ◽  
Coherent Domain Size ◽  
Coherent Domain

scholarly journals Crystal Structures and Spin Crossover in the Polymeric Material [Fe(Htrz)2(trz)](BF4) Including Coherent-Domain Size Reduction Effects

2012 ◽  
Vol 2013 (5-6) ◽  
pp. 796-802 ◽  
Author(s):  
Arnaud Grosjean ◽  
Philippe Négrier ◽  
Pierre Bordet ◽  
Céline Etrillard ◽  
Denise Mondieig ◽  
...  
Keyword(s):  
Crystal Structures ◽  
Polymeric Material ◽  
Spin Crossover ◽  
Domain Size ◽  
Size Reduction ◽  
Coherent Domain Size ◽  
Coherent Domain

Combined texture and microstructure analysis of deformed crystals by high-energy X-ray diffraction

2018 ◽  
Vol 51 (3) ◽  
pp. 883-894 ◽  
Author(s):  
Hao Yuan ◽  
Zhe Chen ◽  
Thomas Buslaps ◽  
Veijo Honkimäki ◽  
András Borbély
Keyword(s):  
Profile Analysis ◽  
Domain Size ◽  
Lorentz Factor ◽  
High Energy ◽  
Microstructure Analysis ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
Coherent Domain Size ◽  
X Ray ◽  
Coherent Domain

It is shown that high-energy X-ray diffraction allows a fast and accurate texture and microstructure analysis of crystals, which can help to set up optimal industrial procedures for materials manufacturing. This paper presents the experimental and theoretical aspects of quantitative texture analysis using high-energy synchrotron beams. Intensity corrections are less important in this approach than in classical laboratory methods; however, the most important correction, related to the Lorentz factor, can introduce relative fraction changes of up to about 40% compared to the uncorrected case. The resolution of the orientation density function also influences the results. For example, the usual 5° resolution leads to relative deviations of up to 30% in the fraction of some components. The method allowed detection of small changes taking place during the recovery and continuous recrystallization of a cold-rolled Al–TiB2 nanocomposite. Texture information was combined with the results of line profile analysis, evidencing the evolution of the average dislocation density and coherent domain size of the selected grain families. It was found that recovery, as described in terms of dislocation annihilation and coherent domain coarsening, takes place at similar rates in all components.

Software for Comparative Analysis of Diffraction-Line Broadening

1995 ◽  
Vol 39 ◽  
pp. 457-464 ◽  
Author(s):  
Davor Balzar ◽  
Hassel Ledbetter
Keyword(s):  
Accurate Determination ◽  
Domain Size ◽  
Distribution Functions ◽  
Diffraction Line ◽  
Line Broadening ◽  
Coherent Domain Size ◽  
Average Value ◽  
Coherent Domain ◽  
Program Output

Program “Breadth” was written for analyzing diffraction-line broadening. The physically broadened line profiles are required as input. The results are calculated according to three ”simplified” integral-breadth methods: Cauchy-Cauchy, Cauchy-Gauss, and Gauss-Gauss. The program output includes volume-weighted coherent domain size and a maximum strain. Furthermore, the root-mean-square strain and both surface-weighted and volume-weighted domain sizes are calculated according to the “double-Voigt” method. This method also allows the accurate determination of both surface-weighted and volume-weighted domain-size distribution functions for specimens showing a dominant size-broadening effect, which gives more detailed information than the mere average value of coherent-domain size. Some examples for ball-milled W (shows simultaneous size-strain broadening) and NiFe2O4 (shows pronounced pure-size broadening) are included.

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