Combined texture and microstructure analysis of deformed crystals by high-energy X-ray diffraction

2018 ◽  
Vol 51 (3) ◽  
pp. 883-894 ◽  
Author(s):  
Hao Yuan ◽  
Zhe Chen ◽  
Thomas Buslaps ◽  
Veijo Honkimäki ◽  
András Borbély
Keyword(s):  
Profile Analysis ◽  
Domain Size ◽  
Lorentz Factor ◽  
High Energy ◽  
Microstructure Analysis ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
Coherent Domain Size ◽  
X Ray ◽  
Coherent Domain

It is shown that high-energy X-ray diffraction allows a fast and accurate texture and microstructure analysis of crystals, which can help to set up optimal industrial procedures for materials manufacturing. This paper presents the experimental and theoretical aspects of quantitative texture analysis using high-energy synchrotron beams. Intensity corrections are less important in this approach than in classical laboratory methods; however, the most important correction, related to the Lorentz factor, can introduce relative fraction changes of up to about 40% compared to the uncorrected case. The resolution of the orientation density function also influences the results. For example, the usual 5° resolution leads to relative deviations of up to 30% in the fraction of some components. The method allowed detection of small changes taking place during the recovery and continuous recrystallization of a cold-rolled Al–TiB2 nanocomposite. Texture information was combined with the results of line profile analysis, evidencing the evolution of the average dislocation density and coherent domain size of the selected grain families. It was found that recovery, as described in terms of dislocation annihilation and coherent domain coarsening, takes place at similar rates in all components.

scholarly journals In situ synchrotron X-ray diffraction line-profile analysis of additively manufactured Ti−6Al−4V alloy under tensile deformation

2020 ◽  
Vol 321 ◽  
pp. 03026
Author(s):  
K. Yamanaka ◽  
A. Kuroda ◽  
M. Ito ◽  
M. Mori ◽  
T. Shobu ◽  
...  
Keyword(s):  
Dislocation Density ◽  
Line Profile ◽  
Tensile Deformation ◽  
Profile Analysis ◽  
High Energy ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Β Phase

In this study, the tensile deformation behavior of an electron beam melted Ti−6Al−4V alloy was examined by in situ X-ray diffraction (XRD) line-profile analysis. The as-built Ti−6Al−4V alloy specimen showed a fine acicular microstructure that was produced through the decomposition of the α′-martensite during the post-melt exposure to high temperatures. Using high-energy synchrotron radiation, XRD line-profile analysis was successfully applied for examining the evolution of dislocation structures not only in the α-matrix but also in the nanosized, low-fraction β-phase precipitates located at the interfaces between the α-laths. The results indicated that the dislocation density was initially higher in the β-phase and an increased dislocation density with increasing applied tensile strain was quantitatively captured in each constitutive phase. It can be thus concluded that the EBM Ti−6Al−4V alloy undergoes a cooperative plastic deformation between the constituent phases in the duplex microstructure. These results also suggested that XRD line-profile analysis combined with highenergy synchrotron XRD measurements can be utilized as a powerful tool for characterizing duplex microstructures in titanium alloys.

Line profile analysis of synchrotron X-ray diffraction data of iron powder with bimodal microstructural profile parameters

2021 ◽  
Vol 54 (2) ◽  
Author(s):  
Ashok Bhakar ◽  
Pooja Gupta ◽  
P. N. Rao ◽  
M. K. Swami ◽  
Pragya Tiwari ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
Line Profile ◽  
Profile Analysis ◽  
Rietveld Method ◽  
Domain Size ◽  
Microstructural Characterization ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Microstructural Parameters

Room-temperature synchrotron X-ray diffraction and subsequent detailed line profile analysis of Fe powder were performed for microstructural characterization. The peak shapes of the diffraction pattern of Fe were found to be super-Lorentzian in nature and the peak widths were anisotropically broadened. These peak profile features of the diffraction pattern are related to the microstructural parameters of the material. In order to elucidate these features of the diffraction pattern, detailed line (peak) profile analyses were performed using the Rietveld method, modified Williamson–Hall plots and whole powder pattern modelling (WPPM), and related microstructural parameters were determined. Profile fitting using the Rietveld and WPPM methods with a single microstructural (unimodal) model shows systematic deviation from the experimentally observed diffraction pattern. On the basis of Rietveld analysis and microstructural modelling it is revealed that the microstructure of Fe consists of two components (bimodal profile). The microstructural parameters of crystallite/domain size distribution, dislocation density, nature of dislocations and phase fraction were evaluated for both components. The results obtained using different methods are compared, and it is shown that diffraction peak profile analysis is capable of modelling such inhomogeneous bimodal microstructures.

Distributions of Domain Size, Lattice Distortion and Dislocation Density in Tubes of Zr-Based Alloys Studied by a Method Combining X-Ray Line Profile Analysis with Texture Measurements

2004 ◽  
Vol 443-444 ◽  
pp. 255-258 ◽  
Author(s):  
Yuriy Perlovich ◽  
Margarita Isaenkova
Keyword(s):  
Dislocation Density ◽  
Lattice Distortion ◽  
Profile Analysis ◽  
Domain Size ◽  
Line Profile Analysis ◽  
Ray Method ◽  
Texture Measurement ◽  
X Ray ◽  
Pole Figures ◽  
Line Analysis

The distributions of substructure parameters for tubes of Zr-based alloys were constructed by use of the X-ray method of Generalized Pole Figures, combining X-ray line analysis and texture measurement. Obtained distributions cover α-Zr crystallites of all orientations and give the fullest description of substructure features of the studied tubes. The interconnection of different substructure parameters are analyzed.

Defect Structures in Neutron Irradiated 6H-SiC Studied by X-Ray Diffraction Line Profile Analysis

2000 ◽  
Vol 640 ◽  
Author(s):  
C. Seitz ◽  
A. Magerl ◽  
R. Hock ◽  
H. Heissenstein ◽  
R. Helbig
Keyword(s):  
Line Profile ◽  
Correlation Length ◽  
Defect Structure ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
Defect Structures ◽  
X Ray Diffraction ◽  
X Ray ◽  
Annealing Temperatures ◽  
Diffraction Line Profile

ABSTRACTWe have investigated by x-ray diffraction defect structures in 6H-SiC after neutron irradiation with different fluences and followed by different annealing procedures. An interpretation along a model of Klimanek [1, 4–6] shows, that higher fluences lead to a stronger than linear reduction of the correlation length, whereas higher annealing temperatures correlate with a better recovery of the correlation length. In addition defects of 1st kind created by irradiation are reduced by annealing. We find that annealing changes the character of the defects and it accentuates a defect structure already present in the original samples.

INVESTIGATION OF SURFACE GRADIENT MICROSTRUCTURE OF SHOT PEENED S30432 STEEL BY X-RAY LINE PROFILE ANALYSIS METHOD

2016 ◽  
Vol 24 (06) ◽  
pp. 1750078 ◽  
Author(s):  
K. ZHAN ◽  
W. Q. FANG ◽  
B. ZHAO ◽  
Y. YAN ◽  
Q. FENG ◽  
...  
Keyword(s):  
Line Profile ◽  
Shot Peening ◽  
Profile Analysis ◽  
Rietveld Method ◽  
Size Variation ◽  
Domain Size ◽  
Line Profile Analysis ◽  
Analysis Method ◽  
X Ray ◽  
Gradient Microstructure

S30432 steels were processed by multistep shot peening treatment. The refined microstructures, including domain size, microstrain, domain size distribution and texture were characterized by X-ray diffraction (XRD) line profile analysis method, respectively. The results demonstrate that in the deformed layers, a gradient structure is formed after shot peening. The domain size reaches 25[Formula: see text]nm at the surface, then it decreases as the depth increases, but microstrain (0.0027) is the largest at the surface. The domain size distributions at different depths calculated by Rietveld method are consistent with domain size variation along the depth. There are no strong textures after shot peening treatment. The change of microhardness along the depth is in accordance with the gradient microstructure. It is expected that this work can offer useful information for characterizing the microstructure of shot peened materials.

X-Ray Diffraction Study of Shock-Modified Tetragonal Phases of SnO2 and MnO2

1992 ◽  
Vol 36 ◽  
pp. 595-601
Author(s):  
P. Newcomer ◽  
B. Morosin ◽  
R. A. Graham
Keyword(s):  
Shock Loading ◽  
Crystal Size ◽  
Lattice Strain ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
Pressure Shock ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Coherent Crystal

AbstractX-ray diffraction line-profile analysis on tetragonal forms of SnO2 (cassiterite), MnO2 (pyrolusite), and previously studied TiO2 (rutile), which were subjected to high pressure shock loading, show that residual lattice strain and coherent “crystal” size are a function of shock parameters. An interesting observation on a sample of MnO2 concerns the recovery of cubic Mn2O3 (bixbyite) in the material subjected to 22 GPa, indicating a shock-induced chemical synthesis.

An Evaluation of Deconvolution Techniques in X-ray Profile Broadening Analysis and the Application of the Maximum Entropy Method to Alumina Data

1994 ◽  
Vol 38 ◽  
pp. 387-395 ◽  
Author(s):  
Walter Kalceff ◽  
Nicholas Armstrong ◽  
James P. Cline
Keyword(s):  
Maximum Entropy ◽  
Maximum Entropy Method ◽  
Profile Analysis ◽  
Domain Size ◽  
Entropy Method ◽  
X Ray Diffraction ◽  
Profile Function ◽  
Diffraction Profile ◽  
X Ray ◽  
Deconvolution Techniques

Abstract This paper reviews several procedures for the removal of instrumental contributions from measured x-ray diffraction profiles, including: direct convolution, unconstrained and constrained deconvolution, an iterative technique, and a maximum entropy method (MEM) which we have adapted to x-ray diffraction profile analysis. Decorevolutions using the maximum entropy approach were found to be the most robust with simulated profiles which included Poisson-distributed noise and uncertainties in the instrument profile function (IPF). The MEM procedure is illustrated by application to the analysis for domain size and microstrain carried out on the four calcined α-alumina candidate materials for Standard Reference Material (SRM) 676 (a quantitative analysis standard for I/Ic determinations), along with the certified material. Williamson-Hall plots of these data were problematic with respect to interpretation of the microstrain, indicating that the line profile standard, SRM 660 (LaB6), exhibits a small amount of strain broadening, particularly at high 2θ angle. The domain sizes for all but one of the test materials were much smaller than the crystallite (particle) size; indicating the presence of low angle grain boundaries.

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