Depth Profiling of Carrier Lifetime in Thick 4H-SiC Epilayers Using Two-Photon Absorption
Keyword(s):
Depth profiling of the ambipolar carrier lifetime was performed in n-type, 140mm thick silicon carbide (SiC) epilayer using excitation by two-photon absorption (TPA) with a pulsed 586nm laser, and confocal measurement of time resolved photoluminescence (TRPL) decay from the excited region. A depth resolution of ≈10mm was obtained. The PL decay curves were analyzed using a recently developed formalism that takes into account the TPA excitation, carrier diffusion and surface/interface recombination. The carrier lifetime decreases near the top surface of the epitaxial layer as well as near its interface with the substrate.
2019 ◽
Vol 15
◽
pp. 2438-2446
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2019 ◽
Vol 28
(01)
◽
pp. 1950003
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Keyword(s):