scholarly journals Influence of Defects on Solar Cell Characteristics

2009 ◽  
Vol 156-158 ◽  
pp. 1-10 ◽  
Author(s):  
Otwin Breitenstein ◽  
Jan Bauer ◽  
Pietro P. Altermatt ◽  
Klaus Ramspeck

The current-voltage (I-V) characteristics of most industrial silicon solar cells deviate rather strongly from the exponential behavior expected from textbook knowledge. Thus, the recombination current may be orders of magnitude larger than expected for the given material quality and often shows an ideality factor larger than 2 in a wide bias-range, which cannot be explained by classical theory either. Sometimes, the cells contain ohmic shunts although the cell’s edges have been perfectly insolated. Even in the absence of such shunts, the characteristics are linear or super-linear under reverse bias, while a saturation would be classically expected. Especially in multicrystalline cells the breakdown does not tend to occur at -50 V reverse bias, as expected, but already at about -15 V or even below. These deviations are typically caused by extended defects in the cells. This paper reviews the present knowledge of the origin of such non-ideal I-V characteristics of silicon solar cells and introduces new results on recombination involving coupled defect levels.

2015 ◽  
Vol 24 (3) ◽  
pp. 326-339 ◽  
Author(s):  
Milan Padilla ◽  
Christian Reichel ◽  
Nikolaus Hagedorn ◽  
Andreas Fell ◽  
Roman Keding ◽  
...  

2007 ◽  
Vol 22 (5) ◽  
pp. 1128-1137 ◽  
Author(s):  
Guozhen Yue ◽  
Baojie Yan ◽  
Gautam Ganguly ◽  
Jeffrey Yang ◽  
Subhendu Guha

Light-induced metastability in hydrogenated nanocrystalline silicon (nc-Si:H) single-junction solar cells was studied systematically. First, we observed no light-induced degradation when the photon energy was lower than the band gap of the amorphous phase; degradation occurred when the energy was higher than the band gap in the amorphous phase. The light-induced degradation could be annealed away at an elevated temperature. We concluded that the light-induced defect generation occurred mainly in the amorphous phase. Second, forward current injection did not degrade the nc-Si:H cell performance. However, a reverse bias during light soaking enhanced the degradation. Third, the nc-Si:H cells made with an optimized hydrogen dilution profile showed minimal degradation although these cells had a high amorphous volume fraction. This indicated that the amorphous volume fraction was not the only factor determining the degradation. Other factors also played important roles in the nc-Si:H stability.


2011 ◽  
Vol 694 ◽  
pp. 672-675
Author(s):  
Tao Li ◽  
Chun Lan Zhou ◽  
Zhen Gang Liu ◽  
Wen Jing Wang ◽  
Yang Song ◽  
...  

In this paper, the dark current-voltage characteristics of p-n junction of silicon solar cells are analysed, with different nickel film thicknesses of 200nm, 400nm and 600nm. The formation of nickel silicide is obtained after the thermal annealing process for 1min, 5min and 10min. The dark current-voltage curves obtained by three kinds of annealing temperature as a function of time are achieved in experiment. The improvement of series resistance extracted from the dark current-voltage curve in the upper voltage range is observed. The influence of nickel film thicknesses on dark current-voltage characteristics of silicon solar cells is confirmed.


2016 ◽  
Vol 147 ◽  
pp. 288-294 ◽  
Author(s):  
M. Barbato ◽  
A. Barbato ◽  
M. Meneghini ◽  
A. Cester ◽  
G. Mura ◽  
...  

2004 ◽  
Vol 85 (18) ◽  
pp. 4222-4224 ◽  
Author(s):  
L. Ferraioli ◽  
P. Maddalena ◽  
A. Parretta ◽  
A. Wang ◽  
J. Zhao

1962 ◽  
Vol 84 (1) ◽  
pp. 33-38 ◽  
Author(s):  
C. Pfeiffer ◽  
P. Schoffer ◽  
B. G. Spars ◽  
J. A. Duffie

Current-voltage characteristics of silicon solar cells cooled by conduction or convection at radiation levels up to 60 langleys per minute are reported for several cell temperatures. Maximum power output noted was approximately 65 milliwatts per square centimeter. The use of cells as flux measuring devices is noted.


2013 ◽  
Vol 23 (4) ◽  
pp. 428-436 ◽  
Author(s):  
Tobias M. Pletzer ◽  
Justus I. van Mölken ◽  
Sven Rißland ◽  
Otwin Breitenstein ◽  
Joachim Knoch

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