scholarly journals Effect of Concentration on the Optical and Solid State Properties of ZnO Thin Films Deposited by Aqueous Chemical Growth (ACG) Method

2012 ◽  
Vol 03 (09) ◽  
pp. 947-954 ◽  
Author(s):  
S. L. Mammah ◽  
F. E. Opara ◽  
F. B. Sigalo ◽  
S. C. Ezugwu ◽  
F. I. Ezema
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Zno Thin Films ◽  
Aqueous Chemical Growth

scholarly journals Effect of Concentration on the Optical and Solid State Properties of ZnO Thin Films Deposited by Aqueous Chemical Growth (ACG) Method

2012 ◽  
Vol 03 (10) ◽  
pp. 1516-1522 ◽  
Author(s):  
Sylvester Lekoo Mammah ◽  
Fidelix Ekeoma Opara ◽  
Friday Barikpe Sigalo ◽  
Sabastine Chukwuemeka Ezugwu ◽  
Fabian Ifeanyichukwu Ezema
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Zno Thin Films ◽  
Aqueous Chemical Growth

scholarly journals Properties of nanostructured ZnO thin films synthesized using a modified aqueous chemical growth method

2019 ◽  
Vol 6 (5) ◽  
pp. 056406 ◽  
Author(s):  
Oliver O Apeh ◽  
Ugochi K Chime ◽  
Solomon Agbo ◽  
Sabastine Ezugwu ◽  
Raymond Taziwa ◽  
...  
Keyword(s):  
Thin Films ◽  
Zno Thin Films ◽  
Aqueous Chemical Growth ◽  
Growth Method

scholarly journals Annealing effect on the optical and solid state properties of cupric oxide thin films deposited using the Aqueous Chemical Growth (ACG) method

2013 ◽  
Vol 05 (03) ◽  
pp. 389-399 ◽  
Author(s):  
Sylvester Lekoo Mammah ◽  
Fidelix Ekeoma Opara ◽  
Valentine Benjamin Omubo-Pepple ◽  
Joseph Effiom-Edem Ntibi ◽  
Sabastine Chukwuemeka Ezugwu ◽  
...  
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Cupric Oxide ◽  
Annealing Effect ◽  
Oxide Thin Films ◽  
Aqueous Chemical Growth

scholarly journals Effect of Concentration on the Optical and Solid State Properties of CoO Thin Films Deposited Using the Aqueous Chemical Growth (ACG) Method

2012 ◽  
Vol 02 (04) ◽  
pp. 232-238
Author(s):  
Sylvester Lekoo Mammah ◽  
Fidelix Ekeoma Opara ◽  
Friday Barikpe Sigalo ◽  
Valentine Benjamin Omobo-Pepple ◽  
Fabian Ifeanyichukwu Ezema ◽  
...  
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Aqueous Chemical Growth

TEM studies of solid-state reactions in sputter-deposited Nb/Al multilayer thin films

1996 ◽  
Vol 54 ◽  
pp. 1020-1021
Author(s):  
F. Ma ◽  
S. Vivekanand ◽  
K. Barmak ◽  
C. Michaelsen
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Stoichiometric Composition ◽  
Analytical Electron Microscopy ◽  
Grain Structure ◽  
Solid State Reactions ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited

Solid state reactions in sputter-deposited Nb/Al multilayer thin films have been studied by transmission and analytical electron microscopy (TEM/AEM), differential scanning calorimetry (DSC) and X-ray diffraction (XRD). The Nb/Al multilayer thin films for TEM studies were sputter-deposited on (1102)sapphire substrates. The periodicity of the films is in the range 10-500 nm. The overall composition of the films are 1/3, 2/1, and 3/1 Nb/Al, corresponding to the stoichiometric composition of the three intermetallic phases in this system.Figure 1 is a TEM micrograph of an as-deposited film with periodicity A = dA1 + dNb = 72 nm, where d's are layer thicknesses. The polycrystalline nature of the Al and Nb layers with their columnar grain structure is evident in the figure. Both Nb and Al layers exhibit crystallographic texture, with the electron diffraction pattern for this film showing stronger diffraction spots in the direction normal to the multilayer. The X-ray diffraction patterns of all films are dominated by the Al(l 11) and Nb(l 10) peaks and show a merging of these two peaks with decreasing periodicity.

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