scholarly journals Application of an In-situ Measurement System to Determine HONO Levels in an Indoor Environment

2007 ◽  
Vol 23 (2) ◽  
pp. 191-202 ◽  
Author(s):  
Jin-Hee Hong ◽  
Jai-Hoon Lee ◽  
Seung-Shik Park
Keyword(s):  
Measurement System ◽  
Indoor Environment ◽  
In Situ Measurement

Field evaluation of permeability of concrete linings and rock masses around underground lined rock caverns by a novel in-situ measurement system

2012 ◽  
Vol 137-138 ◽  
pp. 97-106 ◽  
Author(s):  
Hyung-Mok Kim ◽  
Yanick Lettry ◽  
Dohyun Park ◽  
Dong-Woo Ryu ◽  
Byung-Hee Choi ◽  
...  
Keyword(s):  
Measurement System ◽  
Field Evaluation ◽  
In Situ Measurement ◽  
Rock Masses

In-situ electrical probing of zones of nanoindentation-induced phases of silicon

2008 ◽  
Vol 1146 ◽  
Author(s):  
Simon Ruffell ◽  
Jodie Bradby ◽  
Jim Williams ◽  
Ryan Major ◽  
Oden Warren
Keyword(s):  
High Pressure ◽  
Amorphous Silicon ◽  
Measurement System ◽  
In Situ Measurement ◽  
High Pressure Phase ◽  
Crystalline Phases ◽  
Early Portion ◽  
Two Phases ◽  
Pressure Phase

AbstractPhase transformed zones of silicon have been formed by nanoindentation both at the micro- and nanoscale and electrically probed using an in-situ measurement system. Zones composed of the high pressure crystalline phases (Si-III/Si-XII) have higher conductivity than those of amorphous silicon (a-Si). At the microscale probing laterally across the surface shows that the conductivity varies within the zones composed of the high pressure phases. The sensitivity to the different conductivities of the two phases allows mapping within the zones. Finally, at the nanoscale the conductivity of the high pressure phase zones can be correlated with the position of the pop-out associated with the formation of the phases. The zones have higher conductivity when the pop-out occurs earlier on unloading and we suggest that this is due to the reduction in trace volumes of a-Si formed during the early portion of the unloading cycle.

scholarly journals An In Situ Measurement System for Characterizing Orbital Debris

2016 ◽  
Vol 65 (12) ◽  
pp. 2758-2772 ◽  
Author(s):  
Michael A. Tsao ◽  
Hau T. Ngo ◽  
Robert D. Corsaro ◽  
Christopher R. Anderson
Keyword(s):  
Measurement System ◽  
Orbital Debris ◽  
In Situ Measurement

Development of a deep-sea multi-mode acoustic sediments in situ measurement system

2016 ◽  
Author(s):  
Jiuyi Yuan ◽  
Haibin Yu ◽  
Haiyu Yan ◽  
Li Xu ◽  
Guanbao Li
Keyword(s):  
Measurement System ◽  
Deep Sea ◽  
In Situ Measurement ◽  
Multi Mode

scholarly journals Development of Micro-EDM Incorporating In-situ Measurement System

2014 ◽  
Vol 5 ◽  
pp. 1897-1905 ◽  
Author(s):  
T.R. Venugopal ◽  
Muralidhara ◽  
Rathnamala Rao
Keyword(s):  
Measurement System ◽  
In Situ Measurement ◽  
Micro Edm
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