Interaction Forces between Solid Surfaces in Non-aqueous Solutions

Oleoscience ◽  
2011 ◽  
Vol 11 (7) ◽  
pp. 235-241 ◽  
Author(s):  
Ko HIGASHITANI

Langmuir ◽  
1996 ◽  
Vol 12 (20) ◽  
pp. 4980-4980
Author(s):  
Thomas R. Baekmark ◽  
Gunther Elender ◽  
Daniel D. Lasic ◽  
Erich Sackmann


1997 ◽  
Vol 185 (2) ◽  
pp. 291-296 ◽  
Author(s):  
Laurence Meagher ◽  
Richard M. Pashley


Langmuir ◽  
2007 ◽  
Vol 23 (16) ◽  
pp. 8607-8613 ◽  
Author(s):  
Hua Tan ◽  
Shisheng Huang ◽  
Kun-Lin Yang


2006 ◽  
Vol 326-328 ◽  
pp. 1-4
Author(s):  
Kyung Suk Kim

Two different types of experimental methods have beeen developed for measuring lateral interaction forces between two solid surfaces for nano- and micro-meter scale contacts. One is the type of direct measurement methods which typically utilize AFM instrumentations. In the direct lateral force measurements some size-scale effects are commonly observed due to the effects of adhesion and surface roughness. A recent development of a fine AFM lateral force calibration method, a diamagnetic lateral force calibrator, has made it possible to study such size-scale effects systematically. The other type is the field projection method which requires a high resolution measurement of a deformation field near the edge of a contact. For such measurements a comprehensive map of deformation measurement techniques is introduced in a domain of spatial and strain resolutions. This technique provides a way of assessing the non-uniform distribution of the surface interaction forces for nano and micro-meter scale contacts.



Langmuir ◽  
1995 ◽  
Vol 11 (10) ◽  
pp. 3975-3987 ◽  
Author(s):  
Thomas R. Baekmark ◽  
Gunther Elender ◽  
Daniel D. Lasic ◽  
Erich Sackmann


ACS Nano ◽  
2014 ◽  
Vol 8 (10) ◽  
pp. 10870-10877 ◽  
Author(s):  
Kai Kristiansen ◽  
Philipp Stock ◽  
Theodoros Baimpos ◽  
Sangeetha Raman ◽  
Jaye K. Harada ◽  
...  


1998 ◽  
Vol 37 (5) ◽  
pp. 319-323 ◽  
Author(s):  
Henk J. Busscher ◽  
Albert T. Poortinga ◽  
Rolf Bos


ACS Omega ◽  
2019 ◽  
Vol 4 (15) ◽  
pp. 16674-16682 ◽  
Author(s):  
Yuesheng Gao ◽  
Sunghwan Jung ◽  
Lei Pan


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