scholarly journals Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy

10.5772/19333 ◽  
2011 ◽  
Author(s):  
Elad Koren ◽  
Jonathan E. ◽  
Uri Givan ◽  
Noel Berkovitch ◽  
Eric R. ◽  
...  
Keyword(s):  
Silicon Nanowires ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Nano Scale

Nonuniform doping distribution along silicon nanowires measured by Kelvin probe force microscopy and scanning photocurrent microscopy

2009 ◽  
Vol 95 (9) ◽  
pp. 092105 ◽  
Author(s):  
E. Koren ◽  
Y. Rosenwaks ◽  
J. E. Allen ◽  
E. R. Hemesath ◽  
L. J. Lauhon
Keyword(s):  
Silicon Nanowires ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Scanning Photocurrent Microscopy

Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy

Micron ◽  
2015 ◽  
Vol 79 ◽  
pp. 93-100 ◽  
Author(s):  
Grzegorz Wielgoszewski ◽  
Piotr Pałetko ◽  
Daniel Tomaszewski ◽  
Michał Zaborowski ◽  
Grzegorz Jóźwiak ◽  
...  
Keyword(s):  
Density Distribution ◽  
Silicon Nanowires ◽  
Carrier Density ◽  
Kelvin Probe Force Microscopy ◽  
Scanning Thermal Microscopy ◽  
Kelvin Probe ◽  
Thermal Microscopy ◽  
Force Microscopy

Kelvin probe force microscopy for the nano scale characterization of chalcopyrite solar cell materials and devices

2003 ◽  
Vol 431-432 ◽  
pp. 257-261 ◽  
Author(s):  
S. Sadewasser ◽  
Th. Glatzel ◽  
S. Schuler ◽  
S. Nishiwaki ◽  
R. Kaigawa ◽  
...  
Keyword(s):  
Solar Cell ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Nano Scale ◽  
Scale Characterization

Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

2020 ◽  
Vol 59 (11) ◽  
pp. 115502
Author(s):  
Zhiwei Xing ◽  
Wenxian Yang ◽  
Yukun Zhao ◽  
Junhua Long ◽  
Xuefei Li ◽  
...  
Keyword(s):  
Direct Observation ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Contact Potential ◽  
Force Microscopy ◽  
Scanning Kelvin Probe

Surface photovoltage analysis of thin CdS layers on polycrystalline chalcopyrite absorber layers by Kelvin probe force microscopy

2008 ◽  
Vol 19 (14) ◽  
pp. 145705 ◽  
Author(s):  
Th Glatzel ◽  
M Rusu ◽  
S Sadewasser ◽  
M Ch Lux-Steiner
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Surface Photovoltage ◽  
Kelvin Probe ◽  
Force Microscopy

Kelvin Probe Force Microscopy investigations of High Strength Metallurgical Graphene transferred on low-density polyethylene

2016 ◽  
Vol 157 ◽  
pp. 71-77 ◽  
Author(s):  
Krzysztof Gajewski ◽  
Witold Szymański ◽  
Piotr Niedzielski ◽  
Teodor Gotszalk
Keyword(s):  
High Strength ◽  
Kelvin Probe Force Microscopy ◽  
Low Density Polyethylene ◽  
Low Density ◽  
Kelvin Probe ◽  
Force Microscopy

Identifying DNA mismatches at single-nucleotide resolution by probing individual surface potentials of DNA-capped nanoparticles

Nanoscale ◽  
2018 ◽  
Vol 10 (2) ◽  
pp. 538-547 ◽  
Author(s):  
Hyungbeen Lee ◽  
Sang Won Lee ◽  
Gyudo Lee ◽  
Wonseok Lee ◽  
Kihwan Nam ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Powerful Method ◽  
Kelvin Probe ◽  
Single Nucleotide ◽  
Force Microscopy ◽  
Surface Potentials ◽  
Dna Mismatches ◽  
Nucleotide Resolution ◽  
Single Nucleotide Resolution

Here, we demonstrate a powerful method to discriminate DNA mismatches at single-nucleotide resolution from 0 to 5 mismatches (χ0 to χ5) using Kelvin probe force microscopy (KPFM).

Sign in / Sign up

Export Citation Format

Share Document