Chemical and Thermochemical Recycling of Polymers from Waste Electrical and Electronic Equipment

Trouble shooting electronic equipment: an empirical approach to the identification of certain requirements of a maintenance occupation. (AF Contract No. 33-038-13236, Project No. 507-007-0001.).

PsycEXTRA Dataset ◽

10.1037/e467262004-001 ◽

1954 ◽

Author(s):

Joseph L. Saupe

Keyword(s):

Empirical Approach ◽

Electronic Equipment ◽

Trouble Shooting

Waste electrical and electronic equipment (WEEE) handbook

10.1533/9780857096333 ◽

2012 ◽

Cited By ~ 20

Author(s):

Vannessa Goodship ◽

Ab Stevels

Keyword(s):

Electronic Equipment

An Approach for Practical Use of Common-Mode Noise Reduction Technique for In-Vehicle Electronic Equipment

IEICE Transactions on Communications ◽

10.1587/transcom.e93.b.1788 ◽

2010 ◽

Vol E93-B (7) ◽

pp. 1788-1796 ◽

Cited By ~ 2

Author(s):

Takanori UNO ◽

Kouji ICHIKAWA ◽

Yuichi MABUCHI ◽

Atsushi NAKAMURA ◽

Yuji OKAZAKI ◽

...

Keyword(s):

Noise Reduction ◽

Reduction Technique ◽

Electronic Equipment ◽

Common Mode ◽

Noise Reduction Technique

Miniature Heat Pipes for Thermal Control of Radio-Electronic Equipment

Heat Transfer Research ◽

10.1615/heattransres.v38.i3.50 ◽

2007 ◽

Vol 38 (3) ◽

pp. 245-258 ◽

Cited By ~ 3

Author(s):

Leonid L. Vasiliev ◽

Andrei G. Kulakov ◽

L. L. Vasiliev, Jr ◽

Mikhail I. Rabetskii ◽

A. A. Antukh

Keyword(s):

Heat Pipes ◽

Thermal Control ◽

Electronic Equipment ◽

Radio Electronic

THERMAL ANALYSIS OF PORTABLE ELECTRONIC EQUIPMENT

Proceeding of International Heat Transfer Conference 11 ◽

10.1615/ihtc11.40 ◽

1998 ◽

Author(s):

Katsumi Hisano ◽

Hideo Iwasaki ◽

Masaru Ishizuka

Keyword(s):

Thermal Analysis ◽

Electronic Equipment

THERMAL FIELD PREDICTION IN ELECTRONIC EQUIPMENT

Proceeding of International Heat Transfer Conference 8 ◽

10.1615/ihtc8.4370 ◽

1986 ◽

Author(s):

J. P. Lejannou ◽

M. Cadre ◽

A. Latrobe ◽

A. Viault

Keyword(s):

Thermal Field ◽

Electronic Equipment

OPTIMUM PLANING OF EXPERIMENT IN MANUFACTURING THE ELECTRONIC EQUIPMENT

Telecommunications and Radio Engineering ◽

10.1615/telecomradeng.v70.i8.60 ◽

2011 ◽

Vol 70 (8) ◽

pp. 731-734 ◽

Cited By ~ 3

Author(s):

N. D. Koshevoy ◽

E. M. Kostenko ◽

V. A. Gordienko ◽

V. P. Syroklyn

Keyword(s):

Electronic Equipment

CIRCULAR ECONOMY STRATEGIES FOR ELECTRIC AND ELECTRONIC EQUIPMENT: A FUZZY COGNITIVE MAP

Environmental Engineering and Management Journal ◽

10.30638/eemj.2017.197 ◽

2017 ◽

Vol 16 (8) ◽

pp. 1807-1817 ◽

Cited By ~ 10

Author(s):

Fabiana Tornese ◽

Maria Grazia Gnoni ◽

Giorgio Mossa ◽

Giovanni Mummolo ◽

Rossella Verriello

Keyword(s):

Circular Economy ◽

Cognitive Map ◽

Electronic Equipment ◽

Fuzzy Cognitive Map

Data Center Equipment Reliability Concerns—Contamination Issues, Standards Actions, and Case Studies

ISTFA 2013: Conference Proceedings from the 39th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2013p0438 ◽

2013 ◽

Author(s):

Chris Muller ◽

Chuck Arent ◽

Henry Yu

Keyword(s):

Case Studies ◽

Data Center ◽

Data Centers ◽

Electronic Equipment ◽

Circuit Board ◽

Lead Free ◽

Reliable Operation ◽

Contamination Assessment ◽

Equipment Reliability ◽

Equipment Failures

Abstract Lead-free manufacturing regulations, reduction in circuit board feature sizes and the miniaturization of components to improve hardware performance have combined to make data center IT equipment more prone to attack by corrosive contaminants. Manufacturers are under pressure to control contamination in the data center environment and maintaining acceptable limits is now critical to the continued reliable operation of datacom and IT equipment. This paper will discuss ongoing reliability issues with electronic equipment in data centers and will present updates on ongoing contamination concerns, standards activities, and case studies from several different locations illustrating the successful application of contamination assessment, control, and monitoring programs to eliminate electronic equipment failures.

A Methodology for Characterizing System-Level ESD Sensitivity

ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2004p0277 ◽

2004 ◽

Author(s):

Marie-Pascale Chagny ◽

John A. Naoum

Keyword(s):

Electrostatic Discharge ◽

Computer Systems ◽

Electronic Equipment ◽

Experimental Methodology ◽

Computer Users ◽

System Level ◽

Permanent Damage ◽

Design Improvement ◽

Desktop Computers

Abstract Over the years, failures induced by an electrostatic discharge (ESD) have become a major concern for semiconductor manufacturers and electronic equipment makers. The ESD events that cause destructive failures have been studied extensively [1, 2]. However, not all ESD events cause permanent damage. Some events lead to recoverable failures that disrupt system functionality only temporarily (e.g. reboot, lockup, and loss of data). These recoverable failures are not as well understood as the ones causing permanent damage and tend to be ignored in the ESD literature [3, 4]. This paper analyzes and characterizes how these recoverable failures affect computer systems. An experimental methodology is developed to characterize the sensitivity of motherboards to ESD by simulating the systemlevel ESD events induced by computer users. The manuscript presents a case study where this methodology was used to evaluate the robustness of desktop computers to ESD. The method helped isolate several weak nets contributing to the failures and identified a design improvement. The result was that the robustness of the systems improved by a factor of 2.