scholarly journals Edge states and corner modes in second-order topological phononic crystal plates

2019 ◽  
Vol 12 (9) ◽  
pp. 094003 ◽  
Author(s):  
Shao-yong Huo ◽  
Hong-bo Huang ◽  
Lu-yang Feng ◽  
Jiu-jiu Chen
2019 ◽  
Vol 146 (1) ◽  
pp. 729-735 ◽  
Author(s):  
Shao-yong Huo ◽  
Jiu-jiu Chen ◽  
Lu-yang Feng ◽  
Hong-bo Huang
Keyword(s):  

2007 ◽  
Vol 90 (8) ◽  
pp. 083509 ◽  
Author(s):  
Manzhu Ke ◽  
Zhengyou Liu ◽  
Pei Pang ◽  
Chunyin Qiu ◽  
Degang Zhao ◽  
...  

Nanophotonics ◽  
2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Yong-Heng Lu ◽  
Yao Wang ◽  
Feng Mei ◽  
Yi-Jun Chang ◽  
Hang Zheng ◽  
...  

Abstract First- and second-order topological phases, capable of inherent protection against disorder of materials, have been recently experimentally demonstrated in various artificial materials through observing the topologically protected edge states. Topological phase transition represents a new class of quantum critical phenomena, which is accompanied by the changes related to the bulk topology of energy band structures instead of symmetry. However, it is still a challenge to directly observe the topological phase transitions defined in terms of bulk states. Here, we theoretically and experimentally demonstrate the direct observation of multifarious topological phase transitions with real-space indicator in a single photonic chip, which is formed by integration of 324 × 33 waveguides supporting both first- and second-order topological phases. The trivial-to-first-order, trivial-to-second-order and first-to-second-order topological phase transitions signified by the band gap closure can all be directly detected via photon evolution in the bulk. We further observe the creation and destruction of gapped topological edge states associated with these topological phase transitions. The bulk-state-based route to investigate the high-dimensional and high-order topological features, together with the platform of freely engineering topological materials by three-dimensional laser direct writing in a single photonic chip, opens up a new avenue to explore the mechanisms and applications of artificial devices.


2021 ◽  
Vol 2 (1) ◽  
Author(s):  
Chun-Wei Chen ◽  
Rajesh Chaunsali ◽  
Johan Christensen ◽  
Georgios Theocharis ◽  
Jinkyu Yang

AbstractDemonstration of topological boundary modes in elastic systems has attracted a great deal of attention over the past few years due to its unique protection characteristic. Recently, second-order topological insulators have been proposed in manipulating the topologically protected localized states emerging only at corners. Here, we numerically and experimentally study corner states in a two-dimensional phononic crystal, namely a continuous elastic plate with embedded bolts in a hexagonal pattern. We create interfacial corners by adjoining trivial and non-trivial topological configurations. Due to the rich interaction between the bolts and the continuous elastic plate, we find a variety of corner states of and devoid of topological origin. Strikingly, some of the corner states are not only highly-localized but also tunable. Taking advantage of this property, we experimentally demonstrate asymmetric corner localization in a Z-shaped domain wall. This finding could create interest in exploration of tunable corner states for the use of advanced control of wave localization.


2020 ◽  
Vol 69 (15) ◽  
pp. 156201
Author(s):  
Zhou-Fu Zheng ◽  
Jian-Fei Yin ◽  
Ji-Hong Wen ◽  
Dian-Long Yu

2018 ◽  
Vol 98 (5) ◽  
Author(s):  
Yabin Jin ◽  
Daniel Torrent ◽  
Bahram Djafari-Rouhani
Keyword(s):  

Author(s):  
W. L. Bell

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.


Sign in / Sign up

Export Citation Format

Share Document