Hard X-ray Microprobe and Scanning Microscopy with Spherical-Aberration-Corrected Grazing-Incident Spherical-Concave Mirror Optics

2013 ◽  
Vol 52 (3R) ◽  
pp. 036703
Author(s):  
Yoshio Suzuki ◽  
Akihisa Takeuchi
Keyword(s):  
Spherical Aberration ◽  
Scanning Microscopy ◽  
Concave Mirror ◽  
X Ray ◽  
Aberration Corrected

Improvements in the electron probe forming capabilities and x-ray hole counts in the Philips TEM

1983 ◽  
Vol 41 ◽  
pp. 376-377
Author(s):  
Richard L. McConville
Keyword(s):  
Field Strength ◽  
Electron Probe ◽  
Spherical Aberration ◽  
Focal Length ◽  
Objective Lens ◽  
Parallel Beam ◽  
Tilt Axis ◽  
X Ray ◽  
Small Probe ◽  
Specimen Height

A second generation twin lens has been developed. This symmetrical lens with a wider bore, yet superior values of chromatic and spherical aberration for a given focal length, retains both eucentric ± 60° tilt movement and 20°x ray detector take-off angle at 90° to the tilt axis. Adjust able tilt axis height, as well as specimen height, now ensures almost invariant objective lens strengths for both TEM (parallel beam conditions) and STEM or nano probe (focused small probe) modes.These modes are selected through use of an auxiliary lens situ ated above the objective. When this lens is on the specimen is illuminated with a parallel beam of electrons, and when it is off the specimen is illuminated with a focused probe of dimensions governed by the excitation of the condenser 1 lens. Thus TEM/STEM operation is controlled by a lens which is independent of the objective lens field strength.

Effect of chromatic aberration on atomic-resolved spherical aberration corrected STEM images

2009 ◽  
Vol 110 (1) ◽  
pp. 36-42 ◽  
Author(s):  
Koji Kuramochi ◽  
Takashi Yamazaki ◽  
Yasutoshi Kotaka ◽  
Masahiro Ohtsuka ◽  
Iwao Hashimoto ◽  
...  
Keyword(s):  
Spherical Aberration ◽  
Chromatic Aberration ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

Nonlocality in spherical-aberration-corrected HAADF STEM images

2013 ◽  
Vol 69 (3) ◽  
pp. 289-296 ◽  
Author(s):  
Masahiro Ohtsuka ◽  
Takashi Yamazaki ◽  
Yasutoshi Kotaka ◽  
Hironori Fujisawa ◽  
Masaru Shimizu ◽  
...  
Keyword(s):  
Spherical Aberration ◽  
Aberration Corrected

Visualising alloy fluctuations by spherical-aberration–corrected HRTEM

2010 ◽  
Vol 91 (3) ◽  
pp. 36001 ◽  
Author(s):  
M. J. Casanove ◽  
N. Combe ◽  
F. Houdellier ◽  
M. J. Hÿtch
Keyword(s):  
Spherical Aberration ◽  
Aberration Corrected

scholarly journals Протонпроводящие композиционные материалы на основе соединения Cs-=SUB=-6-=/SUB=-H(HSO-=SUB=-4-=/SUB=-)-=SUB=-3-=/SUB=-(H-=SUB=-2-=/SUB=-PO-=SUB=-4-=/SUB=-)-=SUB=-4-=/SUB=-

2019 ◽  
Vol 61 (12) ◽  
pp. 2375
Author(s):  
В.А. Коморников ◽  
В.В. Гребенев ◽  
И.С. Тимаков ◽  
О.Б. Зайнуллин
Keyword(s):  
Impedance Spectroscopy ◽  
Transport Properties ◽  
Phase Analysis ◽  
Composition Range ◽  
Scanning Microscopy ◽  
Proton Conducting ◽  
X Ray ◽  
Conducting Materials ◽  
Electron Scanning Microscopy

Composite proton-conducting materials xCs6H (HSO4) 3 (H2PO4) 4+ (1 - x) AlPO4 were obtained in the composition range (x = 0.9–0.7). The methods of x-ray phase analysis, impedance spectroscopy, electron scanning microscopy studied their physicochemical and transport properties.

scholarly journals Structural Analysis at an Atomic Scale Using Spherical Aberration Corrected Electron Microscope

2012 ◽  
Vol 54 (3) ◽  
pp. 159-165
Author(s):  
Yoshifumi OSHIMA ◽  
Yasumasa TANISHIRO ◽  
Takayuki TANAKA ◽  
Kunio TAKAYANAGI
Keyword(s):  
Electron Microscope ◽  
Structural Analysis ◽  
Spherical Aberration ◽  
Atomic Scale ◽  
Aberration Corrected
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