Switching characteristics of a 4H-SiC insulated-gate bipolar transistor with interface defects up to the nonquasi-static regime

2015 ◽  
Vol 54 (4S) ◽  
pp. 04DP11 ◽  
Author(s):  
Iliya Pesic ◽  
Dondee Navarro ◽  
Masato Fujinaga ◽  
Yoshiharu Furui ◽  
Mitiko Miura-Mattausch
2014 ◽  
Author(s):  
I. Pesic ◽  
D. Navarro ◽  
M. Fujinaga ◽  
Y. Furui ◽  
M. Miura-Mattausch

2021 ◽  
Author(s):  
Hongming Ma ◽  
Wenyuan Zhang ◽  
Yan Wang

Abstract A 10kV-level silicon carbide (SiC) insulated gate bipolar transistor (IGBT) with field limiting rings (FLRs) is designed and simulated with Sentaurus TCAD, the detailed optimization method and comparisons are presented in this paper. Linearly varying spacing between rings is introduced to SiC IGBT and adjustment is performed on width of rings, the final structure achieves a breakdown voltage over 12kV with a termination length of 164.5 µm , which is 69.93% lower than that of conventional structure with a fixed ring spacing. Moreover, the final design can decrease the sensitivity to the interface charges, the tolerance to positive surface charges exceeds 8 × 10 11 cm − 2 , which is 3.5 times that of the conventional structure. Besides, double pulse measurements prove no degradation of conduction and switching characteristics.


2012 ◽  
Vol 33 (12) ◽  
pp. 1684-1686 ◽  
Author(s):  
Huaping Jiang ◽  
Jin Wei ◽  
Bo Zhang ◽  
Wanjun Chen ◽  
Ming Qiao ◽  
...  

2015 ◽  
Vol 36 (6) ◽  
pp. 591-593 ◽  
Author(s):  
Hao Feng ◽  
Wentao Yang ◽  
Yuichi Onozawa ◽  
Takashi Yoshimura ◽  
Akira Tamenori ◽  
...  

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