Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy

2016 ◽  
Vol 55 (8S1) ◽  
pp. 08NB10 ◽  
Author(s):  
Takeshi Uruma ◽  
Nobuo Satoh ◽  
Hidekazu Yamamoto
Keyword(s):  
Depletion Layer ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

Kelvin Probe Force Microscopy investigations of High Strength Metallurgical Graphene transferred on low-density polyethylene

2016 ◽  
Vol 157 ◽  
pp. 71-77 ◽  
Author(s):  
Krzysztof Gajewski ◽  
Witold Szymański ◽  
Piotr Niedzielski ◽  
Teodor Gotszalk
Keyword(s):  
High Strength ◽  
Kelvin Probe Force Microscopy ◽  
Low Density Polyethylene ◽  
Low Density ◽  
Kelvin Probe ◽  
Force Microscopy

Identifying DNA mismatches at single-nucleotide resolution by probing individual surface potentials of DNA-capped nanoparticles

Nanoscale ◽  
2018 ◽  
Vol 10 (2) ◽  
pp. 538-547 ◽  
Author(s):  
Hyungbeen Lee ◽  
Sang Won Lee ◽  
Gyudo Lee ◽  
Wonseok Lee ◽  
Kihwan Nam ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Powerful Method ◽  
Kelvin Probe ◽  
Single Nucleotide ◽  
Force Microscopy ◽  
Surface Potentials ◽  
Dna Mismatches ◽  
Nucleotide Resolution ◽  
Single Nucleotide Resolution

Here, we demonstrate a powerful method to discriminate DNA mismatches at single-nucleotide resolution from 0 to 5 mismatches (χ0 to χ5) using Kelvin probe force microscopy (KPFM).

Kelvin Probe Force Microscopy in Surface Chemistry: Reactivity of Pd Nanoparticles on Highly Oriented Pirolytic Graphite

ACS Catalysis ◽  
2014 ◽  
Vol 4 (6) ◽  
pp. 1838-1844 ◽  
Author(s):  
Elisa Palacios-Lidón ◽  
Claude R. Henry ◽  
Clemens Barth
Keyword(s):  
Surface Chemistry ◽  
Pd Nanoparticles ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

Thin films of amphiphilic polyelectrolytes. Soft materials characterized by Kelvin probe force microscopy

Polymer ◽  
2013 ◽  
Vol 54 (21) ◽  
pp. 5733-5740 ◽  
Author(s):  
X.G. Briones ◽  
M.D. Urzúa ◽  
H.E. Ríos ◽  
F.J. Espinoza-Beltrán ◽  
R. Dabirian ◽  
...  
Keyword(s):  
Thin Films ◽  
Soft Materials ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

scholarly journals Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy

2021 ◽  
Vol 10 (1) ◽  
Author(s):  
Ting-Xiao Qin ◽  
En-Ming You ◽  
Mao-Xin Zhang ◽  
Peng Zheng ◽  
Xiao-Feng Huang ◽  
...  
Keyword(s):  
Solar Cell ◽  
Grain Boundaries ◽  
Cell Performance ◽  
Kelvin Probe Force Microscopy ◽  
Light Illumination ◽  
Kelvin Probe ◽  
Solar Cell Performance ◽  
Force Microscopy ◽  
Infrared Spectroscopic

AbstractOrganic–inorganic halide perovskites are emerging materials for photovoltaic applications with certified power conversion efficiencies (PCEs) over 25%. Generally, the microstructures of the perovskite materials are critical to the performances of PCEs. However, the role of the nanometer-sized grain boundaries (GBs) that universally existing in polycrystalline perovskite films could be benign or detrimental to solar cell performance, still remains controversial. Thus, nanometer-resolved quantification of charge carrier distribution to elucidate the role of GBs is highly desirable. Here, we employ correlative infrared-spectroscopic nanoimaging by the scattering-type scanning near-field optical microscopy with 20 nm spatial resolution and Kelvin probe force microscopy to quantify the density of electrons accumulated at the GBs in perovskite polycrystalline thin films. It is found that the electron accumulations are enhanced at the GBs and the electron density is increased from 6 × 1019 cm−3 in the dark to 8 × 1019 cm−3 under 10 min illumination with 532 nm light. Our results reveal that the electron accumulations are enhanced at the GBs especially under light illumination, featuring downward band bending toward the GBs, which would assist in electron-hole separation and thus be benign to the solar cell performance.

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