scholarly journals Elucidating the charge state of an Au nanocluster on the oxidized/reduced rutile TiO2 (110) surface using non-contact atomic force microscopy and Kelvin probe force microscopy

2020 ◽  
Vol 2 (6) ◽  
pp. 2371-2375 ◽  
Author(s):  
Yuuki Adachi ◽  
Huan Fei Wen ◽  
Quanzhen Zhang ◽  
Masato Miyazaki ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Charge State ◽  
High Vacuum ◽  
Kelvin Probe Force Microscopy ◽  
Ultra High Vacuum ◽  
Kelvin Probe ◽  
Au Nanoclusters ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force

The charge state of Au nanoclusters on oxidized/reduced rutile TiO2 (110) surfaces were investigated by a combination of non-contact atomic force microscopy and Kelvin probe force microscopy at 78 K under ultra-high vacuum.

High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy

1999 ◽  
Vol 75 (2) ◽  
pp. 286-288 ◽  
Author(s):  
Ch. Sommerhalter ◽  
Th. W. Matthes ◽  
Th. Glatzel ◽  
A. Jäger-Waldau ◽  
M. Ch. Lux-Steiner
Keyword(s):  
Atomic Force Microscopy ◽  
High Vacuum ◽  
High Sensitivity ◽  
Ultra High Vacuum ◽  
Kelvin Probe ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Laser cleaning of exfoliated graphene

2012 ◽  
Vol 1455 ◽  
Author(s):  
Oliver Ochedowski ◽  
Benedict Kleine Bußmann ◽  
Marika Schleberger
Keyword(s):  
Local Heating ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Ambient Conditions ◽  
Kelvin Probe ◽  
Structural Modifications ◽  
Force Microscopy ◽  
Exfoliated Graphene ◽  
Atomic Force ◽  
P Type

ABSTRACTWe have employed atomic force and Kelvin-Probe force microscopy to study graphene sheets exfoliated on TiO2 under the influence of local heating achieved by laser irradiation. Exfoliation and irradiation took place under ambient conditions, the measurements were performed in ultra high vacuum. We show that after irradiation times of 6 min, an increase of the surface potential is observed which indicates a decrease of p-type carrier concentration. We attribute this effect to the removal of adsorbates like water and oxygen. After irradiation times of 12 min our topography images reveal severe structural modifications of graphene. These resemble the nanocrystallite network which form on graphene/SiO2 but after much longer irradiation times. From our results we propose that short laser heating at moderate powers might offer a way to clean graphene without inducing unwanted structural modifications.

scholarly journals Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy

ACS Nano ◽  
2018 ◽  
Vol 12 (6) ◽  
pp. 5274-5283 ◽  
Author(s):  
Fabian Schulz ◽  
Juha Ritala ◽  
Ondrej Krejčí ◽  
Ari Paavo Seitsonen ◽  
Adam S. Foster ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Atomic Force

Atomic-scale friction on diamond(111) studied by ultra-high vacuum atomic force microscopy

1997 ◽  
Vol 384 (1-3) ◽  
pp. L828-L835 ◽  
Author(s):  
R.J.A. van den Oetelaar ◽  
C.F.J. Flipse
Keyword(s):  
Atomic Force Microscopy ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Atomic Scale ◽  
Force Microscopy ◽  
Atomic Force

Development of a Self-Excited Oscillator for SI-Traceable Measurements in Atomic Force Microscopy

2008 ◽  
Author(s):  
Gregory W. Vogl ◽  
Jon R. Pratt
Keyword(s):  
Atomic Force Microscopy ◽  
International System ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Transducers ◽  
Analog Control ◽  
System Of Units ◽  
Excited Oscillator

A new self-excited micro-oscillator is proposed as a velocity reference that could aid the dissemination of nanonewton-level forces that are traceable to the International System of Units (SI). An analog control system is developed to keep the actuation side of the device oscillating sinusoidally with an amplitude that is fairly insensitive to the quality factor. Consequently, the device can be calibrated as a velocity reference in air and used in ultra-high vacuum with a velocity shift of less than one percent. Hence, the calibrated micro-oscillator could be used with electrostatic forces to calibrate cantilevers used for atomic force microscopy (AFM) as SI-traceable force transducers. Furthermore, the calibrated micro-oscillator could potentially be used as an AFM sensor to achieve atomic resolutions on par with those realized in frequency-modulation AFM (FM-AFM) with quartz tuning forks.

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