Comparing high-purity c- and m-plane GaN layers for Schottky barrier diodes grown homoepitaxially by metalorganic vapor phase epitaxy
2018 ◽
Vol 57
(10)
◽
pp. 105501
◽
2011 ◽
Vol 50
(1R)
◽
pp. 011201
◽
1988 ◽
Vol 27
(Part 2, No. 3)
◽
pp. L441-L443
◽
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