Ohmic Contact of p-Type ZnSe Using Heavily Alkaline Doped p+-ZnSe by Excimer Laser Doping Technique

1997 ◽  
Author(s):  
Toru Aoki ◽  
Akira Ishibashi ◽  
Masaharu Nagai ◽  
Yoshinori Hatanaka
2015 ◽  
Vol 336 ◽  
pp. 182-187 ◽  
Author(s):  
G. López ◽  
P. Ortega ◽  
M. Colina ◽  
C. Voz ◽  
I. Martín ◽  
...  

1989 ◽  
Vol 49 (6) ◽  
pp. 723-727 ◽  
Author(s):  
K. Sugioka ◽  
K. Toyoda ◽  
K. Tachi ◽  
M. Otsuka

1998 ◽  
Vol 184-185 ◽  
pp. 425-428 ◽  
Author(s):  
Y. Hatanaka ◽  
T. Aoki ◽  
T. Arakawa ◽  
D. Noda ◽  
Y. Nakanishi

2015 ◽  
Vol 77 ◽  
pp. 752-758 ◽  
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Gema López ◽  
Pablo R. Ortega ◽  
Isidro Martín ◽  
Cristóbal Voz ◽  
Anna B. Morales ◽  
...  

2002 ◽  
Vol 229 (2) ◽  
pp. 911-914 ◽  
Author(s):  
T. Aoki ◽  
Y. Shimizu ◽  
A. Miyake ◽  
A. Nakamura ◽  
Y. Nakanishi ◽  
...  

2002 ◽  
Vol 46 (5) ◽  
pp. 689-693 ◽  
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S.E. Mohney ◽  
B.A. Hull ◽  
J.Y. Lin ◽  
J. Crofton

2014 ◽  
Vol 53 (5S3) ◽  
pp. 05HA04 ◽  
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Jae-Kwan Kim ◽  
Dong-min Lee ◽  
Sung-Nam Lee ◽  
Keun-Man Song ◽  
Jae-Sik Yoon ◽  
...  
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1991 ◽  
Vol 236 ◽  
Author(s):  
A. Slaoui ◽  
M. Elliq ◽  
H. Pattyn ◽  
E. Fogarassy ◽  
S. De Unamuno ◽  
...  

AbstractThis work describes phosphorus (P) and boron (B) doping of polysilicon filns deposited on quartz. Doping is achieved by means of a pulsed ArF excimer laser to melt a controlled thickness of amorphous or polycristalline silicon film coated with a spinon silicate glass (SOG) film containing the dopant (P or B). We have investigated the influence of doping parameters such as laser fluence, number of shots and dopant film thickness on the sheet resistance and the incorporation rate. From these results, we have shown that high doped, shallow junctions presenting sheet resistance lower than 5 kΩ/∠ can be obtained. Poly-Si TFT's with good electrical characteristics were successfully fabricated using this doping technique.


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