Effects of Reactive Ti Creating Oxygen Vacancy Inside TiO2 on Resistive Switching Characteristics in Resistive Random Access Memory Device

2010 ◽  
Author(s):  
S. J. Kim ◽  
M. G. Sung ◽  
W. G. Kim ◽  
J. Y. Kim ◽  
J. H. Yoo ◽  
...  
2011 ◽  
Vol 1292 ◽  
Author(s):  
Jung Won Seo ◽  
Seung Jae Baik ◽  
Sang Jung Kang ◽  
Koeng Su Lim

ABSTRACTThis report covers the resistive switching characteristics of cross-bar type semi-transparent (or see-through) resistive random access memory (RRAM) devices based on ZnO. In order to evaluate the transmittance of the devices, we designed the memory array with various electrode sizes and spaces between the electrodes. To prevent read disturbance problems due to sneak currents, we employed a metal oxide based p-NiO/n-ZnO diode structure, which exhibited good rectifying characteristics and high forward current density. Based on these results, we found that the combined metal oxide diode/RRAM device could be promising candidate with suppressed read disturbances of cross-bar type ZnO RRAM device.


2014 ◽  
Vol 115 (9) ◽  
pp. 094305 ◽  
Author(s):  
Min Ju Yun ◽  
Hee-Dong Kim ◽  
Seok Man Hong ◽  
Ju Hyun Park ◽  
Dong Su Jeon ◽  
...  

2011 ◽  
Vol 50 (4S) ◽  
pp. 04DD15 ◽  
Author(s):  
Kyung-Chang Ryoo ◽  
Jeong-Hoon Oh ◽  
Sunghun Jung ◽  
Hongsik Jeong ◽  
Byung-Gook Park

Sign in / Sign up

Export Citation Format

Share Document