Resistive Switching Characteristics of Resistive Random Access Memory Based on a BaxSr1-xTiO3 Thin Film Grown by a Hydrothermal Method

2019 ◽  
Vol 40 (9) ◽  
pp. 1411-1414
Author(s):  
Jie Zhu ◽  
Jing He ◽  
Jingjing Lu ◽  
Changcheng Ma ◽  
Xiongfei Tao ◽  
...  
2011 ◽  
Vol 1292 ◽  
Author(s):  
Jung Won Seo ◽  
Seung Jae Baik ◽  
Sang Jung Kang ◽  
Koeng Su Lim

ABSTRACTThis report covers the resistive switching characteristics of cross-bar type semi-transparent (or see-through) resistive random access memory (RRAM) devices based on ZnO. In order to evaluate the transmittance of the devices, we designed the memory array with various electrode sizes and spaces between the electrodes. To prevent read disturbance problems due to sneak currents, we employed a metal oxide based p-NiO/n-ZnO diode structure, which exhibited good rectifying characteristics and high forward current density. Based on these results, we found that the combined metal oxide diode/RRAM device could be promising candidate with suppressed read disturbances of cross-bar type ZnO RRAM device.


2014 ◽  
Vol 60 (1) ◽  
pp. 1015-1020
Author(s):  
R. Chen ◽  
J. Y. Wang ◽  
C. J. Chen ◽  
L. W. Zhou ◽  
H. Jiang ◽  
...  

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