A blackbox yield estimation workflow with Gaussian process regression applied to the design of electromagnetic devices

In this paper an efficient and reliable method for stochastic yield estimation is presented. Since one main challenge of uncertainty quantification is the computational feasibility, we propose a hybrid approach where most of the Monte Carlo sample points are evaluated with a surrogate model, and only a few sample points are reevaluated with the original high fidelity model. Gaussian process regression is a non-intrusive method which is used to build the surrogate model. Without many prerequisites, this gives us not only an approximation of the function value, but also an error indicator that we can use to decide whether a sample point should be reevaluated or not. For two benchmark problems, a dielectrical waveguide and a lowpass filter, the proposed methods outperform classic approaches.

Stochastic yield catastrophes and robustness in self-assembly

A guiding principle in self-assembly is that, for high production yield, nucleation of structures must be significantly slower than their growth. However, details of the mechanism that impedes nucleation are broadly considered irrelevant. Here, we analyze self-assembly into finite-sized target structures employing mathematical modeling. We investigate two key scenarios to delay nucleation: (i) by introducing a slow activation step for the assembling constituents and, (ii) by decreasing the dimerization rate. These scenarios have widely different characteristics. While the dimerization scenario exhibits robust behavior, the activation scenario is highly sensitive to demographic fluctuations. These demographic fluctuations ultimately disfavor growth compared to nucleation and can suppress yield completely. The occurrence of this stochastic yield catastrophe does not depend on model details but is generic as soon as number fluctuations between constituents are taken into account. On a broader perspective, our results reveal that stochasticity is an important limiting factor for self-assembly and that the specific implementation of the nucleation process plays a significant role in determining the yield.

On forward and inverse uncertainty quantification for models involving hysteresis operators

Parameters within hysteresis operators modeling real world objects have to be identified from measurements and are therefore subject to corresponding errors. To investigate the influence of these errors, the methods of Uncertainty Quantification (UQ) are applied. Results of forward UQ for a play operator with a stochastic yield limit are presented. Moreover, inverse UQ is performed to identify the parameters in the weight function in a Prandtl-Ishlinskiĭ operator and the uncertainties of these parameters.

Stochastic Yield Catastrophes and Robustness in Self-Assembly

ABSTRACTA guiding principle in self-assembly is that, for high production yield, nucleation of structures must be significantly slower than their growth. However, details of the mechanism that impedes nucleation are broadly considered irrelevant. Here, we analyze self-assembly into finite-sized target structures employing mathematical modeling. We investigate two key scenarios to delay nucleation: (i) by introducing a slow activation step for the assembling constituents and, (ii) by decreasing the dimerization rate. These scenarios have widely different characteristics. While the dimerization scenario exhibits robust behavior, the activation scenario is highly sensitive to demographic fluctuations. These demographic fluctuations ultimately disfavor growth compared to nucleation and can suppress yield completely. The occurrence of this stochastic yield catastrophe does not depend on model details but is generic as soon as number fluctuations between constituents are taken into account. On a broader perspective, our results reveal that stochasticity is an important limiting factor for self-assembly and that the specific implementation of the nucleation process plays a significant role in determining the yield.