impurity segregation
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2021 ◽  
Vol 130 (2) ◽  
pp. 025702
Author(s):  
Jinping Luo ◽  
Yunjie Cheng ◽  
Chenyang Zhou ◽  
Talid Sinno ◽  
Lijun Liu

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
I. Medouni ◽  
A. Portavoce ◽  
P. Maugis ◽  
P. Eyméoud ◽  
M. Yescas ◽  
...  

AbstractDislocation engineering in crystalline materials is essential when designing materials for a large range of applications. Segregation of additional elements at dislocations is frequently used to modify the influence of dislocations on material properties. Thus, the influence of the dislocation elastic field on impurity segregation is of major interest, as its understanding should lead to engineering solutions that improve the material properties. We report the experimental study of the elastic field influence on atomic segregation in the core and in the area surrounding edge dislocations in Fe-based alloys. Each element is found either to segregate in the edge dislocation core or to form atmospheres. The elastic field has a strong effect on the segregation atmosphere, but no effect on the dislocation core segregation. The theory is in good agreement with experiments, and should support dislocation engineering.


2020 ◽  
Vol 91 (11) ◽  
pp. 2000046
Author(s):  
Ji-Yeon Jeong ◽  
Byung-Tae Kim ◽  
Sang-Hum Kwon ◽  
Myeong-Hun Kang ◽  
Dong-Gyu Kim ◽  
...  

ChemNanoMat ◽  
2019 ◽  
Vol 5 (5) ◽  
pp. 634-641 ◽  
Author(s):  
Matthias Niedermaier ◽  
Chatpawee Taniteerawong ◽  
Thomas Schwab ◽  
Gregor Zickler ◽  
Johannes Bernardi ◽  
...  
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Micromachines ◽  
2019 ◽  
Vol 10 (2) ◽  
pp. 127 ◽  
Author(s):  
Yanfeng Jiang ◽  
Wenjie Wang ◽  
Zirui Wang ◽  
Jian-Ping Wang

Silicon nanowire (SiNW) is always accompanied by severe impurity segregation and inhomogeneous distribution, which deteriorates the SiNWs electrical characteristics. In this paper, a method for phosphorus doping incorporation in SiNW was proposed using plasma. It showed that this method had a positive effect on the doping concentration of the wires with a diameter ranging from 5 nm to 20 nm. Moreover, an SiNW transistor was assembled based on the nanowire with a 5 nm diameter. The device’s ION/IOFF ratio reached 104. The proposed incorporation method could be helpful to improve the effect of the dopants in the silicon nanowire at a nanometer scale.


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