Enhancement of wavefront measurement sensitivity in a zonal wavefront sensor without curtailing the sensing speed

In this paper we propose a zonal wavefront sensing scheme that facilitates wavefront measurement with enhanced sensitivity at the standard video rate. We achieve this enhanced sensitivity by implementing a sequential display of binary holograms described over each zone sampling the incident wavefront with the help of a ferroelectric liquid crystal spatial light modulator. By keeping the number of active zones as 24 and using a camera with an imaging frame rate equal to the binary hologram display rate of the spatial light modulator, we are able to reach the sensing frame rate of 60 Hz. In addition to enhancement in sensitivity, the proposed scheme facilitates zone wise tuning of binary holograms and eliminates the possibility of any crosstalk between adjacent zones. We perform a proof-of-principle experiment that validates the proposed zonal wavefront sensing scheme and demonstrates its advantages.

X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors

X-ray single-grating interferometry was applied to conduct accurate wavefront corrections for hard X-ray nanofocusing mirrors. Systematic errors in the interferometer, originating from a grating, a detector, and alignment errors of the components, were carefully examined. Based on the measured wavefront errors, the mirror shapes were directly corrected using a differential deposition technique. The corrected X-ray focusing mirrors with a numerical aperture of 0.01 attained two-dimensionally diffraction-limited performance. The results of the correction indicate that the uncertainty of the wavefront measurement was less than λ/72 in root-mean-square value.

Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning Technique

A speckle-based method for the X-ray crystal diffraction wavefront measurement is implemented, and the slope errors of channel-cut crystals with different surface characteristics are measured. The method uses a speckle scanning technique generated by a scattering membrane translated using a piezo motor to infer the deflection of X-rays from the crystals. The method provides a high angular sensitivity of the channel-cut crystal slopes in both the tangential and sagittal directions. The experimental results show that the slope error of different cutting and etching processes ranges from 0.25 to 2.98 μrad. Furthermore, the results of wavefront deformation are brought into the beamline for simulation. This method opens up possibilities for new high-resolution applications for X-ray crystal diffraction wavefront measurement and provides feedback to crystal manufacturers to improve channel-cut fabrication.