Post-FEC Performance of Pilot-Aided Carrier Phase Estimation over Cycle Slip

The POST-forward error correction (FEC) bit error rate (BER) performance and the cycle-slip (CS) probability of the carrier phase estimation (CPE) scheme based on Viterbi–Viterbi phase estimation (VVPE) algorithm and the VV cascaded by pilot-aided-phase-unwrap (PAPU) algorithm have been experimentally investigated in a 56 Gbit/s quadrature phase-shift keying (QPSK) coherent communication system. Experimental results show that, with 0.78% pilot overhead, the VVPE + PAPU scheme greatly improves the POST-FEC performance degraded by continuous CS, maintaining a low CS probability with less influence of filter length. Comparing with the VVPE scheme, the VVPE + PAPU scheme can respectively obtain about 3.1 dB, 1.3 dB, 0.6 dB PRE-FEC optical signal noise ratio (OSNR) gains at PRE-BER of 1.8 × 10−2. Meanwhile, the VVPE + PAPU scheme respectively achieves about 3 dB, 1 dB, and 0.5 dB POST-FEC OSNR gain and improves the FEC limit from 2.5 × 10−3 to 1.4 × 10−2, from 8.9 × 10−3 to 1.8 × 10−2, and from 1.6 × 10−2 to 1.9 × 10−2 under the CPE filter length of 8, 16, and 20.

Adaptive Structured Light with Scatter Correction for High-Precision Underwater 3D Measurements

High-precision underwater 3D cameras are required to automate many of the traditional subsea inspection, maintenance and repair (IMR) operations. In this paper we introduce a novel multi-frequency phase stepping (structured light) method for high-precision 3D estimation even in turbid water. We introduce an adaptive phase-unwrapping procedure which uses the phase-uncertainty to determine the highest frequency that can be reliably unwrapped. Light scattering adversely affects the phase estimate. We propose to remove the effect of forward scatter with an unsharp filter and a model-based method to remove the backscatter effect. Tests in varying turbidity show that the scatter correction removes the adverse effect of scatter on the phase estimates. The adaptive frequency unwrapping with scatter correction results in images with higher accuracy and precision and less phase unwrap errors than the Gray-Code Phase Stepping (GCPS) approach.

Study on Measurement of Thin Film Thickness with Lateral Shearing Interferometry

The film thickness is an important technical indicator of film devices, and its accuracy directly affects various performances of optical components. In fabrication process of film device, fast and accurate measurement of film thickness has positive significance on product quality control. In this paper, measure film thickness with lateral shearing interferometry. Collect interferograms through structured lateral shearing interference platform, process interferogram with Fast Fourier Transform method to extract phase, unwrap the wrapped phase to achieve phase value. Finally, calculate film thickness based on lateral shearing interference principle. The thickness of sample is 119.6800nm measured by this method, basically the same with the result 120.6036nm that measured by ZYGO interferometer. This experiment shows that lateral shearing interferometry not only suit to measurement of film thickness, but also abundant high-precision method of measuring film thickness, and has high practical value.