Features of Melt Droplet Formation during Electrical Destruction Aluminum Films on the Semiconductor Surface

The work is devoted to processes during melting of thin aluminium film on silicon surface in pulse current mode. An experiment was conducted to study the dynamics during the onset of the liquid phase on a metal film. Besides, the process of formation droplet localization zones is considered. The experimental part revealed critical current values ​ during an electrical explosion of thin metal films near the thermal shock source. Using the oscillographic method, the temperature profile of the metallization track is calculated.

Solid State Conversion: Microstructuring of Crystalline Al2O3 (Sapphire) by Annealing of Patterned Aluminium Films

Surface structuring on the nano/micro level is important for a huge range of areas. A critical bottle neck for many industrial applications is upscaling; that is to say it must be possible to do the structuring in a comparatively simple and inexpensive manner. However, this is a challenge for many industrially important materials, including sapphire. A few years ago, solid state conversion was introduced as a relatively simply nanoscale structuring method for sapphire. Here we show that the method, by careful choice of parameters, can be extended to work also on the micron scale. We show that a microstructured aluminium film deposited on a Al2O3 (0001) surface is converted into a crystalline Al2O3 surface, when thermally annealed in air, using optimized parameters.

Fabrication of black aluminium thin films by magnetron sputtering

A black aluminium film deposited by magnetron sputtering showed a high correlation of diffuse reflectivity with surface morphology and nitrogen content in plasma.

Solar Selective Coating for Thermal Applications

We present the results obtained using Cr2O3 as selective absorbing layer on aluminium film substrate. The thin films were deposited by electron beam evaporation using a multiple crucible e-gun able to deposit 4 materials in sequence without breaking the vacuum. Optical characterization of the multilayer films is based on ellipsometry and hemispherical reflectivity. The complex refractive index has been determinate and it has been used to design a selective solar absorber with high absorptance.