ACCELERATING OF THE ELECTRONS OF ELECTRON BUNCHES IN A WAVEGUIDE LOADED DIELECTRIC STRUCTURE

The paper presents some results of experimental studies of the excitation of wake fields and the acceleration of electrons in waveguide-dielectric structures (DS) upon injection of a sequence of electron bunches into them. Exper-iments have shown an increase in the amplitude of the wake wave and the acceleration of a small fraction of elec-trons when the wavelength of the excited field is equal to the doubled bunch length. A simple physical model of the observed phenomenon is given. Also, the paper proposes a method for accelerating a part of each electron bunch in the steady-state mode of the resonator dielectric structure. Some of the electrons are “cut out” by the collimator and enter the accelerating phase of the previously excited wake wave. The wave is displaced due to the difference in the distances traveled by the wave and the accelerated part of the electrons.

COMPARATIVE ANALYSIS OF ACCELERATION GRADIENTS FOR CHIP STRUCTURES WITH DIFFERENT REFRACTIVE INDICES

The results of numerical studies of accelerating gradients in accelerators based on dielectric chip structures with different refractive indices, excited by a titanium-sapphire laser pulse, are presented. A comparative analysis of the influence of the refractive index on the rate of acceleration of electron bunches is carried out. Promising materials for the manufacture of dielectric laser accelerators are proposed.

Radioluminescence Response of Ce-, Cu-, and Gd-Doped Silica Glasses for Dosimetry of Pulsed Electron Beams

Radiation-induced emission of doped sol-gel silica glass samples was investigated under a pulsed 20-MeV electron beam. The studied samples were drawn rods doped with cerium, copper, or gadolinium ions, which were connected to multimode pure-silica core fibers to transport the induced luminescence from the irradiation area to a signal readout system. The luminescence pulses in the samples induced by the electron bunches were studied as a function of deposited dose per electron bunch. All the investigated samples were found to have a linear response in terms of luminescence as a function of electron bunch sizes between 10−5 Gy/bunch and 1.5×10−2 Gy/bunch. The presented results show that these types of doped silica rods can be used for monitoring a pulsed electron beam, as well as to evaluate the dose deposited by the individual electron bunches. The electron accelerator used in the experiment was a medical type used for radiation therapy treatments, and these silica rod samples show high potential for dosimetry in radiotherapy contexts.

THz-Enhanced DC Ultrafast Electron Diffractometer

Terahertz- (THz-) based electron manipulation has recently been shown to hold tremendous promise as a technology for manipulating and driving the next generation of compact ultrafast electron sources. Here, we demonstrate an ultrafast electron diffractometer with THz-driven pulse compression. The electron bunches from a conventional DC gun are compressed by a factor of 10 and reach a duration of ~180 fs (FWHM) with 10,000 electrons/pulse at a 1 kHz repetition rate. The resulting ultrafast electron source is used in a proof-of-principle experiment to probe the photoinduced dynamics of single-crystal silicon. The THz-compressed electron beams produce high-quality diffraction patterns and enable the observation of the ultrafast structural dynamics with improved time resolution. These results validate the maturity of THz-driven ultrafast electron sources for use in precision applications.