14th Asian Test Symposium (ATS'05)
Latest Publications

TOTAL DOCUMENTS

113

(FIVE YEARS 0)

H-INDEX

10

(FIVE YEARS 0)

Published By IEEE

0769524818

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

IEEE Std 1500 Compliant Infrastructure forModular SOC Testing

14th Asian Test Symposium (ATS'05) ◽

10.1109/ats.2005.67 ◽

2005 ◽

Author(s):

T. Waayers ◽

E.J. Marinissen ◽

M. Lousberg

Keyword(s):

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Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops

14th Asian Test Symposium (ATS'05) ◽

10.1109/ats.2005.46 ◽

2005 ◽

Author(s):

Dong Xiang ◽

Kai wei Li ◽

Hideo Fujiwara

Keyword(s):

Cost Effective ◽

Scan Testing ◽

Design For Cost

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Design of a CMOS Operational Amplifier for Extreme-Voltage Stress Test

14th Asian Test Symposium (ATS'05) ◽

10.1109/ats.2005.49 ◽

2005 ◽

Author(s):

Shaolei Quan ◽

Qiang Qiang ◽

Chin-Long Wey

Keyword(s):

Operational Amplifier ◽

Stress Test ◽

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Optimal Schemes for ADC BIST Based on Histogram

14th Asian Test Symposium (ATS'05) ◽

10.1109/ats.2005.86 ◽

2005 ◽

Author(s):

Yong-sheng Wang ◽

Jin-xiang Wang ◽

Feng-chang Lai ◽

Yi-zheng Ye

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High Level Test Generation / SW based Embedded Test

14th Asian Test Symposium (ATS'05) ◽

10.1109/ats.2005.64 ◽

2005 ◽

Author(s):

P. Parvathala

Keyword(s):

Test Generation ◽

Embedded Test ◽

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Boundary Value Testing based on UML Models

14th Asian Test Symposium (ATS'05) ◽

10.1109/ats.2005.31 ◽

2005 ◽

Author(s):

P. Samuel ◽

R. Mall

Keyword(s):

Boundary Value ◽

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Power-Constrained Area and Time Co-Optimization for SoCs Based on Consecutive Testability

14th Asian Test Symposium (ATS'05) ◽

10.1109/ats.2005.88 ◽

2005 ◽

Author(s):

T. Yoneda ◽

H. Takakuwa ◽

H. Fujiwara

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A Statistical Approach to Area-Constrained Yield Enhancement for Pipelined Circuits under Parameter Variations

14th Asian Test Symposium (ATS'05) ◽

10.1109/ats.2005.16 ◽

2005 ◽

Author(s):

A. Datta ◽

S. Bhunia ◽

S. Mukhopadhyay ◽

K. Roy

Keyword(s):

Statistical Approach ◽

Yield Enhancement ◽

Parameter Variations ◽

Pipelined Circuits

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Author Index

14th Asian Test Symposium (ATS'05) ◽

10.1109/ats.2005.28 ◽

2005 ◽

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Partial Gating Optimization for Power Reduction During Test Application

14th Asian Test Symposium (ATS'05) ◽

10.1109/ats.2005.87 ◽

2005 ◽

Author(s):

M. ElShoukry ◽

M. Tehranipoor ◽

C.P. Ravikumar

Keyword(s):

Power Reduction ◽

Test Application

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