14th Asian Test Symposium (ATS'05)
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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Optimal Schemes for ADC BIST Based on Histogram

2005 ◽  
Author(s):  
Yong-sheng Wang ◽  
Jin-xiang Wang ◽  
Feng-chang Lai ◽  
Yi-zheng Ye

IEEE Std 1500 Compliant Infrastructure forModular SOC Testing

2005 ◽  
Author(s):  
T. Waayers ◽  
E.J. Marinissen ◽  
M. Lousberg
Keyword(s):  
Soc Testing

Low Power Test Compression Technique for Designs with Multiple Scan Chain

2005 ◽  
Author(s):  
Youhua Shi ◽  
N. Togawa ◽  
M. Yanagisawa ◽  
T. Ohtsuki ◽  
S. Kimura
Keyword(s):  
Low Power ◽  
Compression Technique ◽  
Power Test ◽  
Test Compression ◽  
Low Power Test ◽  
Multiple Scan ◽  
Scan Chain
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