14th Asian Test Symposium (ATS'05)
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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Optimal Schemes for ADC BIST Based on Histogram

2005 ◽  
Author(s):  
Yong-sheng Wang ◽  
Jin-xiang Wang ◽  
Feng-chang Lai ◽  
Yi-zheng Ye

High Level Test Generation / SW based Embedded Test

2005 ◽  
Author(s):  
P. Parvathala
Keyword(s):  
Test Generation ◽  
Embedded Test ◽  
High Level

Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops

2005 ◽  
Author(s):  
Dong Xiang ◽  
Kai wei Li ◽  
Hideo Fujiwara
Keyword(s):  
Cost Effective ◽  
Scan Testing ◽  
Design For Cost

Design of a CMOS Operational Amplifier for Extreme-Voltage Stress Test

2005 ◽  
Author(s):  
Shaolei Quan ◽  
Qiang Qiang ◽  
Chin-Long Wey
Keyword(s):  
Operational Amplifier ◽  
Stress Test ◽  
Voltage Stress

IEEE Std 1500 Compliant Infrastructure forModular SOC Testing

2005 ◽  
Author(s):  
T. Waayers ◽  
E.J. Marinissen ◽  
M. Lousberg
Keyword(s):  
Soc Testing

Low Power Test Compression Technique for Designs with Multiple Scan Chain

2005 ◽  
Author(s):  
Youhua Shi ◽  
N. Togawa ◽  
M. Yanagisawa ◽  
T. Ohtsuki ◽  
S. Kimura
Keyword(s):  
Low Power ◽  
Compression Technique ◽  
Power Test ◽  
Test Compression ◽  
Low Power Test ◽  
Multiple Scan ◽  
Scan Chain

Boundary Value Testing based on UML Models

2005 ◽  
Author(s):  
P. Samuel ◽  
R. Mall
Keyword(s):  
Boundary Value ◽  
Uml Models

Power-Constrained Area and Time Co-Optimization for SoCs Based on Consecutive Testability

2005 ◽  
Author(s):  
T. Yoneda ◽  
H. Takakuwa ◽  
H. Fujiwara
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