2010 IEEE International Integrated Reliability Workshop Final Report
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TOTAL DOCUMENTS

55

(FIVE YEARS 0)

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6

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Published By IEEE

9781424485215

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Recovery of negative and positive bias temperature stress in pMOSFETs

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706473 ◽

2010 ◽

Author(s):

Ph. Hehenberger ◽

H. Reisinger ◽

T. Grasser

Keyword(s):

Temperature Stress ◽

Positive Bias ◽

Bias Temperature Stress

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Investigation into the effect of a “through silicon via”-process on the MOS transistor reliability of a standard 0.13µm CMOS technology

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706485 ◽

2010 ◽

Author(s):

Andreas Martin ◽

Ludger Borucki ◽

Hans Reisinger ◽

Christian Schlunder

Keyword(s):

Cmos Technology ◽

Through Silicon Via ◽

Mos Transistor ◽

Transistor Reliability

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Memory reliability model for accumulated and clustered soft errors

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706501 ◽

2010 ◽

Author(s):

Soonyoung Lee ◽

Sanghyeon Baeg ◽

Pedro Reviriego

Keyword(s):

Soft Errors ◽

Reliability Model

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Copper - top interconnect reliability for mixed signal applications

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706483 ◽

2010 ◽

Author(s):

Jonggook Kim ◽

Barry O'Connell ◽

W. K. Teng ◽

Mark W. Poulter

Keyword(s):

Mixed Signal ◽

Interconnect Reliability

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Defects in low-κ dielectrics and etch stop layers for use as interlayer dielectrics in ULSI

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706482 ◽

2010 ◽

Author(s):

B.C. Bittel ◽

T.A. Pomorski ◽

P.M. Lenahan ◽

S. King

Keyword(s):

Interlayer Dielectrics ◽

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Multiple microscopic defects characterization methods to improve macroscopic degradation modeling of MOSFETs

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706487 ◽

2010 ◽

Author(s):

Y. Mamy Randriamihaja ◽

A. Bravaix ◽

V. Huard ◽

D. Rideau ◽

M. Rafik ◽

...

Keyword(s):

Characterization Methods ◽

Degradation Modeling

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Title page

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706468 ◽

2010 ◽

Keyword(s):

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Soft errors — Past history and recent discoveries

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706479 ◽

2010 ◽

Author(s):

Charles Slayman

Keyword(s):

Past History ◽

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Hot carrier impact on the small signal equivalent circuit

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706489 ◽

2010 ◽

Author(s):

L. Negre ◽

D. Roy ◽

S. Boret ◽

P. Scheer ◽

N. Kauffmann ◽

...

Keyword(s):

Equivalent Circuit ◽

Small Signal ◽

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Foundry reliability engineering requirement & challenges

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706477 ◽

2010 ◽

Author(s):

Wee Loon Ng

Keyword(s):

Reliability Engineering ◽

Engineering Requirement

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