2010 IEEE International Integrated Reliability Workshop Final Report
Latest Publications

TOTAL DOCUMENTS

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H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781424485215

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Investigation into the effect of a “through silicon via”-process on the MOS transistor reliability of a standard 0.13µm CMOS technology

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706485 ◽

2010 ◽

Author(s):

Andreas Martin ◽

Ludger Borucki ◽

Hans Reisinger ◽

Christian Schlunder

Keyword(s):

Cmos Technology ◽

Through Silicon Via ◽

Mos Transistor ◽

Transistor Reliability

Memory reliability model for accumulated and clustered soft errors

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706501 ◽

2010 ◽

Cited By ~ 2

Author(s):

Soonyoung Lee ◽

Sanghyeon Baeg ◽

Pedro Reviriego

Keyword(s):

Soft Errors ◽

Reliability Model

Copper - top interconnect reliability for mixed signal applications

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706483 ◽

2010 ◽

Author(s):

Jonggook Kim ◽

Barry O'Connell ◽

W. K. Teng ◽

Mark W. Poulter

Keyword(s):

Mixed Signal ◽

Interconnect Reliability

Recovery of negative and positive bias temperature stress in pMOSFETs

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706473 ◽

2010 ◽

Cited By ~ 7

Author(s):

Ph. Hehenberger ◽

H. Reisinger ◽

T. Grasser

Keyword(s):

Temperature Stress ◽

Positive Bias ◽

Bias Temperature Stress

Soft errors — Past history and recent discoveries

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706479 ◽

2010 ◽

Cited By ~ 13

Author(s):

Charles Slayman

Keyword(s):

Past History ◽

Soft Errors

Defects in low-κ dielectrics and etch stop layers for use as interlayer dielectrics in ULSI

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706482 ◽

2010 ◽

Cited By ~ 1

Author(s):

B.C. Bittel ◽

T.A. Pomorski ◽

P.M. Lenahan ◽

S. King

Keyword(s):

Interlayer Dielectrics ◽

Etch Stop

Multiple microscopic defects characterization methods to improve macroscopic degradation modeling of MOSFETs

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706487 ◽

2010 ◽

Cited By ~ 5

Author(s):

Y. Mamy Randriamihaja ◽

A. Bravaix ◽

V. Huard ◽

D. Rideau ◽

M. Rafik ◽

...

Keyword(s):

Characterization Methods ◽

Degradation Modeling

Title page

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706468 ◽

2010 ◽

Keyword(s):

Title Page

Hot carrier impact on the small signal equivalent circuit

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706489 ◽

2010 ◽

Cited By ~ 3

Author(s):

L. Negre ◽

D. Roy ◽

S. Boret ◽

P. Scheer ◽

N. Kauffmann ◽

...

Keyword(s):

Equivalent Circuit ◽

Small Signal ◽

Hot Carrier

Foundry reliability engineering requirement & challenges

2010 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/iirw.2010.5706477 ◽

2010 ◽

Author(s):

Wee Loon Ng

Keyword(s):

Reliability Engineering ◽

Engineering Requirement

2010 IEEE International Integrated Reliability Workshop Final ReportLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Investigation into the effect of a “through silicon via”-process on the MOS transistor reliability of a standard 0.13µm CMOS technology

Memory reliability model for accumulated and clustered soft errors

Copper - top interconnect reliability for mixed signal applications

Recovery of negative and positive bias temperature stress in pMOSFETs

Soft errors — Past history and recent discoveries

Defects in low-κ dielectrics and etch stop layers for use as interlayer dielectrics in ULSI

Multiple microscopic defects characterization methods to improve macroscopic degradation modeling of MOSFETs

Title page

Hot carrier impact on the small signal equivalent circuit

Foundry reliability engineering requirement & challenges

2010 IEEE International Integrated Reliability Workshop Final Report
Latest Publications