11th IEEE International On-Line Testing Symposium
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A 32-bit COTS-based fault-tolerant embedded system

11th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2005.5 ◽

2005 ◽

Cited By ~ 1

Author(s):

Amir Rajabzadeh

Keyword(s):

Embedded System ◽

Fault Tolerant

Analytical semi-empirical model for SER sensitivity estimation of deep-submicron CMOS circuits

11th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2005.15 ◽

2005 ◽

Cited By ~ 27

Author(s):

T. Heijmen

Keyword(s):

Empirical Model ◽

Deep Submicron ◽

Cmos Circuits ◽

Sensitivity Estimation ◽

Submicron Cmos ◽

Semi Empirical

Overview of soft errors issues in aerospace systems

11th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2005.55 ◽

2005 ◽

Cited By ~ 1

Author(s):

C. Boleat ◽

G. Colas

Keyword(s):

Soft Errors ◽

Aerospace Systems

IEEE Computer Society TTTC: Test Technology Technical Council

11th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2005.35 ◽

2005 ◽

Keyword(s):

Technical Council ◽

Ieee Computer Society ◽

Test Technology

Introduction to fault attacks on smartcard

11th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2005.39 ◽

2005 ◽

Cited By ~ 1

Author(s):

A. Lemarechal

Keyword(s):

Fault Attacks

Heavy ion effects on configuration logic of Virtex FPGAs

11th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2005.31 ◽

2005 ◽

Cited By ~ 7

Author(s):

M. Alderighi ◽

A. Candelori ◽

F. Casini ◽

S. D'Angelo ◽

M. Mancini ◽

...

Keyword(s):

Heavy Ion ◽

Ion Effects

Evaluation of SET and SEU effects at multiple abstraction levels

11th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2005.28 ◽

2005 ◽

Cited By ~ 12

Author(s):

L. Anghel ◽

R. Leveugle ◽

P. Vanhauwaert

Keyword(s):

Abstraction Levels

On-chip self-calibration of RF circuits using specification-driven built-in self test (S-BIST)

11th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2005.50 ◽

2005 ◽

Cited By ~ 7

Author(s):

Donghoon Han ◽

S.S. Akbay ◽

S. Bhattacharya ◽

A. Chatterjee ◽

W.R. Eisenstadt

Keyword(s):

Rf Circuits ◽

Self Calibration ◽

Self Test ◽

Built In Self Test ◽

On Chip

Security constraints in integrated circuits

11th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2005.61 ◽

2005 ◽

Author(s):

L. Sourgen

Keyword(s):

Integrated Circuits