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11th IEEE International On-Line Testing Symposium
Latest Publications
TOTAL DOCUMENTS
71
(FIVE YEARS 0)
H-INDEX
12
(FIVE YEARS 0)
Published By IEEE
0769524060
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Latest Documents
Most Cited Documents
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IEEE Computer Society TTTC: Test Technology Technical Council
11th IEEE International On-Line Testing Symposium
◽
10.1109/iolts.2005.35
◽
2005
◽
Keyword(s):
Technical Council
◽
Ieee Computer Society
◽
Test Technology
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Introduction to fault attacks on smartcard
11th IEEE International On-Line Testing Symposium
◽
10.1109/iolts.2005.39
◽
2005
◽
Cited By ~ 1
Author(s):
A. Lemarechal
Keyword(s):
Fault Attacks
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Analytical semi-empirical model for SER sensitivity estimation of deep-submicron CMOS circuits
11th IEEE International On-Line Testing Symposium
◽
10.1109/iolts.2005.15
◽
2005
◽
Cited By ~ 27
Author(s):
T. Heijmen
Keyword(s):
Empirical Model
◽
Deep Submicron
◽
Cmos Circuits
◽
Sensitivity Estimation
◽
Submicron Cmos
◽
Semi Empirical
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Overview of soft errors issues in aerospace systems
11th IEEE International On-Line Testing Symposium
◽
10.1109/iolts.2005.55
◽
2005
◽
Cited By ~ 1
Author(s):
C. Boleat
◽
G. Colas
Keyword(s):
Soft Errors
◽
Aerospace Systems
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A 32-bit COTS-based fault-tolerant embedded system
11th IEEE International On-Line Testing Symposium
◽
10.1109/iolts.2005.5
◽
2005
◽
Cited By ~ 1
Author(s):
Amir Rajabzadeh
Keyword(s):
Embedded System
◽
Fault Tolerant
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Heavy ion effects on configuration logic of Virtex FPGAs
11th IEEE International On-Line Testing Symposium
◽
10.1109/iolts.2005.31
◽
2005
◽
Cited By ~ 7
Author(s):
M. Alderighi
◽
A. Candelori
◽
F. Casini
◽
S. D'Angelo
◽
M. Mancini
◽
...
Keyword(s):
Heavy Ion
◽
Ion Effects
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Evaluation of SET and SEU effects at multiple abstraction levels
11th IEEE International On-Line Testing Symposium
◽
10.1109/iolts.2005.28
◽
2005
◽
Cited By ~ 12
Author(s):
L. Anghel
◽
R. Leveugle
◽
P. Vanhauwaert
Keyword(s):
Abstraction Levels
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On-chip self-calibration of RF circuits using specification-driven built-in self test (S-BIST)
11th IEEE International On-Line Testing Symposium
◽
10.1109/iolts.2005.50
◽
2005
◽
Cited By ~ 7
Author(s):
Donghoon Han
◽
S.S. Akbay
◽
S. Bhattacharya
◽
A. Chatterjee
◽
W.R. Eisenstadt
Keyword(s):
Rf Circuits
◽
Self Calibration
◽
Self Test
◽
Built In Self Test
◽
On Chip
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Security constraints in integrated circuits
11th IEEE International On-Line Testing Symposium
◽
10.1109/iolts.2005.61
◽
2005
◽
Author(s):
L. Sourgen
Keyword(s):
Integrated Circuits
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11th IEEE International On-Line Testing Symposium
11th IEEE International On-Line Testing Symposium
◽
10.1109/iolts.2005.4
◽
2005
◽
Keyword(s):
On Line
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