Noise in Nanoscale Semiconductor Devices
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Published By Springer International Publishing

9783030374990, 9783030375003
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Defect-Based Compact Modeling of Random Telegraph Noise

2020 ◽  
pp. 517-552
Author(s):  
Pieter Weckx ◽  
Ben Kaczer ◽  
Marko Simicic ◽  
Bertrand Parvais ◽  
Dimitri Linten
Keyword(s):  
Compact Modeling ◽  
Random Telegraph Noise ◽  
Telegraph Noise

Random Telegraph Noise in Flash Memories

2020 ◽  
pp. 201-227
Author(s):  
Alessandro S. Spinelli ◽  
Christian Monzio Compagnoni ◽  
Andrea L. Lacaita
Keyword(s):  
Flash Memories ◽  
Random Telegraph Noise ◽  
Telegraph Noise

Oxide Trap-Induced RTS in MOSFETs

2020 ◽  
pp. 553-607
Author(s):  
A. S. M. Shamsur Rouf ◽  
Zeynep Çelik-Butler
Keyword(s):  
Oxide Trap

Low-Frequency Noise in III–V, Ge, and 2D Transistors

2020 ◽  
pp. 335-357
Author(s):  
Mengwei Si ◽  
Xuefei Li ◽  
Wangran Wu ◽  
Sami Alghamdi ◽  
Peide Ye
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

Systematic Characterization of Random Telegraph Noise and Its Dependence with Magnetic Fields in MOSFET Devices

2020 ◽  
pp. 135-174
Author(s):  
Carlos Marquez ◽  
Oscar Huerta ◽  
Adrian I. Tec-Chim ◽  
Fernando Guarin ◽  
Edmundo A. Gutierrez-D ◽  
...  
Keyword(s):  
Magnetic Fields ◽  
Random Telegraph Noise ◽  
Telegraph Noise

An Overview on Statistical Modeling of Random Telegraph Noise in the Frequency Domain

2020 ◽  
pp. 495-516
Author(s):  
Thiago H. Both ◽  
Maurício Banaszeski da Silva ◽  
Gilson I. Wirth ◽  
Hans P. Tuinhout ◽  
Adrie Zegers-van Duijnhoven ◽  
...  
Keyword(s):  
Frequency Domain ◽  
Statistical Modeling ◽  
Random Telegraph Noise ◽  
Telegraph Noise
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