[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium
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102

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High-density and very fine-pitch IC packages: a technology assessment

[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium ◽

10.1109/iemt.1991.279767 ◽

2002 ◽

Author(s):

R. Ray

Keyword(s):

Technology Assessment ◽

High Density ◽

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Multichip modules fabrication, a transition from prototypes to production

[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium ◽

10.1109/iemt.1991.279789 ◽

2002 ◽

Author(s):

J.J.H. Reche

Keyword(s):

Multichip Modules

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Real time process planning for PCB assembly

[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium ◽

10.1109/iemt.1991.279786 ◽

2002 ◽

Author(s):

J.A. Cecil ◽

K. Srihari ◽

C.R. Emerson

Keyword(s):

Real Time ◽

Process Planning ◽

Time Process ◽

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Automated assembly of new 3D molded interconnection devices

[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium ◽

10.1109/iemt.1991.279805 ◽

2002 ◽

Author(s):

K. Feldmann ◽

J. Franke

Keyword(s):

Automated Assembly

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Modeling of performance-related design trade-offs in multi-chip assemblies

[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium ◽

10.1109/iemt.1991.279808 ◽

2002 ◽

Author(s):

O.A. Palusinski ◽

J.H. Hohl

Keyword(s):

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Process based cost modeling

[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium ◽

10.1109/iemt.1991.279825 ◽

2002 ◽

Author(s):

C. Bloch ◽

R. Ranganthan

Keyword(s):

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Survey of various statistical process control methods

[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium ◽

10.1109/iemt.1991.279821 ◽

2002 ◽

Author(s):

S. Kumar

Keyword(s):

Process Control ◽

Statistical Process Control ◽

Control Methods ◽

Statistical Process

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Development of fine pitch and high lead count ceramic QFP

[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium ◽

10.1109/iemt.1991.279772 ◽

2002 ◽

Author(s):

Y. Nakatsuka ◽

Y. Tamura ◽

T. Okabayashi ◽

H. Fujii ◽

M. Yokochi

Keyword(s):

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A statistical method to integrate manufacturing tolerance in high-speed digital circuit design

[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium ◽

10.1109/iemt.1991.279823 ◽

2002 ◽

Author(s):

N. Goel ◽

K.S. Kalaichelvan ◽

B. Bleuer

Keyword(s):

Statistical Method ◽

Circuit Design ◽

Digital Circuit ◽

Manufacturing Tolerance ◽

Digital Circuit Design

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IC manufacturing diagnosis based on statistical analysis techniques

[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium ◽

10.1109/iemt.1991.279824 ◽

2002 ◽

Author(s):

J.K. Kibarian ◽

A.J. Strojwas

Keyword(s):

Statistical Analysis ◽

Analysis Techniques ◽

Ic Manufacturing

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