Characterization of High Tc Materials and Devices by Electron Microscopy
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Published By Cambridge University Press

9780521554909, 9780521031707, 9780511534829

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Microstructures in superconducting YBa2Cu3O7 thin films

Characterization of High Tc Materials and Devices by Electron Microscopy ◽

10.1017/cbo9780511534829.013 ◽

2000 ◽

pp. 285-318

Author(s):

A. F. Marshall

Keyword(s):

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Grain boundaries in high Tc materials: transport properties and structure

Characterization of High Tc Materials and Devices by Electron Microscopy ◽

10.1017/cbo9780511534829.011 ◽

2000 ◽

pp. 235-262 ◽

Author(s):

K. L. Merkle ◽

Y. Gao ◽

B. V. Vuchic

Keyword(s):

Grain Boundaries ◽

Transport Properties ◽

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Scanning tunneling microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy ◽

10.1017/cbo9780511534829.007 ◽

2000 ◽

pp. 125-160

Author(s):

M. E. Hawley

Keyword(s):

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy

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Low-temperature scanning electron microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy ◽

10.1017/cbo9780511534829.006 ◽

2000 ◽

pp. 103-124

Author(s):

R. P. Huebener

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Low Temperature ◽

Temperature Scanning ◽

Scanning Electron

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Holography in the transmission electron microscope

Characterization of High Tc Materials and Devices by Electron Microscopy ◽

10.1017/cbo9780511534829.003 ◽

2000 ◽

pp. 23-38

Author(s):

A. Tonomura

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Transmission Electron

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Investigations on the microstructure of YBa2Cu3O7 thin-film edge Josephson junctions by high-resolution electron microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy ◽

10.1017/cbo9780511534829.014 ◽

2000 ◽

pp. 319-354

Author(s):

C. L. Jia ◽

K. Urban

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

High Resolution ◽

Josephson Junctions ◽

High Resolution Electron Microscopy ◽

Resolution Electron

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Investigation of charge distribution in Bi2Sr2CaCu2O8 and YBa2Cu3O7

Characterization of High Tc Materials and Devices by Electron Microscopy ◽

10.1017/cbo9780511534829.010 ◽

2000 ◽

pp. 215-234

Author(s):

Y. Zhu

Keyword(s):

Charge Distribution

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Identification of new superconducting compounds by electron microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy ◽

10.1017/cbo9780511534829.008 ◽

2000 ◽

pp. 161-192

Author(s):

G. Van Tendeloo ◽

T. Krekels

Keyword(s):

Electron Microscopy ◽

Superconducting Compounds

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Specimen preparation for transmission electron microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy ◽

10.1017/cbo9780511534829.005 ◽

2000 ◽

pp. 69-102 ◽

Author(s):

J. G. Wen

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Specimen Preparation ◽

Transmission Electron

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Microanalysis by scanning transmission electron microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy ◽

10.1017/cbo9780511534829.004 ◽

2000 ◽

pp. 39-68

Author(s):

L. M. Brown ◽

J. Yuan

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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