Springer Series in Optical Sciences - Frontiers in Optical Methods
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Published By Springer Berlin Heidelberg

9783642405938, 9783642405945

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Broadband Terahertz Spectroscopy of Thin Films

Springer Series in Optical Sciences - Frontiers in Optical Methods ◽

10.1007/978-3-642-40594-5_9 ◽

2013 ◽

pp. 167-184

Author(s):

Ikufumui Katayama ◽

Masaaki Ashida

Keyword(s):

Thin Films ◽

Terahertz Spectroscopy ◽

Broadband Terahertz

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Sate-of-the-Art of Terahertz Science and Technology

Springer Series in Optical Sciences - Frontiers in Optical Methods ◽

10.1007/978-3-642-40594-5_8 ◽

2013 ◽

pp. 153-166

Author(s):

Masayoshi Tonouchi

Keyword(s):

Science And Technology

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Coherent Phonon Dynamics in Carbon Nanotubes

Springer Series in Optical Sciences - Frontiers in Optical Methods ◽

10.1007/978-3-642-40594-5_6 ◽

2013 ◽

pp. 105-127

Author(s):

Keiko Kato ◽

Katsuya Oguri ◽

Masahiro Kitajima

Keyword(s):

Carbon Nanotubes ◽

Coherent Phonon ◽

Phonon Dynamics

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Time-Resolved X-Ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation

Springer Series in Optical Sciences - Frontiers in Optical Methods ◽

10.1007/978-3-642-40594-5_5 ◽

2013 ◽

pp. 85-103

Author(s):

Yoshihito Tanaka

Keyword(s):

Synchrotron Radiation ◽

Lattice Dynamics ◽

X Ray Diffraction ◽

Time Resolved ◽

X Ray

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Infrared and Terahertz Synchrotron Radiation: Optics and Applications

Springer Series in Optical Sciences - Frontiers in Optical Methods ◽

10.1007/978-3-642-40594-5_4 ◽

2013 ◽

pp. 63-81 ◽

Cited By ~ 3

Author(s):

Shin-ichi Kimura

Keyword(s):

Synchrotron Radiation

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Real-Time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy

Springer Series in Optical Sciences - Frontiers in Optical Methods ◽

10.1007/978-3-642-40594-5_2 ◽

2013 ◽

pp. 29-44

Author(s):

Shin-ya Ohno ◽

Ken-ichi Shudo ◽

Masatoshi Tanaka

Keyword(s):

Real Time ◽

Oxidation Process ◽

Reflectance Spectroscopy ◽

Difference Spectroscopy ◽

Time Analysis ◽

Initial Oxidation ◽

Real Time Analysis ◽

Reflectance Difference Spectroscopy

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Material Evaluation with Optical Measurement Systems: Focusing on Terahertz Spectroscopy

Springer Series in Optical Sciences - Frontiers in Optical Methods ◽

10.1007/978-3-642-40594-5_12 ◽

2013 ◽

pp. 213-224

Author(s):

Keiko Kitagishi

Keyword(s):

Optical Measurement ◽

Terahertz Spectroscopy ◽

Measurement Systems ◽

Material Evaluation

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Single-Photon Counting and Passive Microscopy of Terahertz Radiation

Springer Series in Optical Sciences - Frontiers in Optical Methods ◽

10.1007/978-3-642-40594-5_11 ◽

2013 ◽

pp. 197-212 ◽

Cited By ~ 1

Author(s):

Kenji Ikushima

Keyword(s):

Terahertz Radiation ◽

Single Photon ◽

Photon Counting ◽

Single Photon Counting

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Development of In-Vacuum Microscope Under High Pressure and Its Applications

Springer Series in Optical Sciences - Frontiers in Optical Methods ◽

10.1007/978-3-642-40594-5_3 ◽

2013 ◽

pp. 45-62

Author(s):

Takao Nanba

Keyword(s):

High Pressure

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Introduction: Ultra-Fast Response of Ultra-Thin Materials on Solid Surfaces

Springer Series in Optical Sciences - Frontiers in Optical Methods ◽

10.1007/978-3-642-40594-5_1 ◽

2013 ◽

pp. 1-25

Author(s):

Ken-ichi Shudo

Keyword(s):

Fast Response ◽

Solid Surfaces

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Springer Series in Optical Sciences - Frontiers in Optical MethodsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Broadband Terahertz Spectroscopy of Thin Films

Sate-of-the-Art of Terahertz Science and Technology

Coherent Phonon Dynamics in Carbon Nanotubes

Time-Resolved X-Ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation

Infrared and Terahertz Synchrotron Radiation: Optics and Applications

Real-Time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy

Material Evaluation with Optical Measurement Systems: Focusing on Terahertz Spectroscopy

Single-Photon Counting and Passive Microscopy of Terahertz Radiation

Development of In-Vacuum Microscope Under High Pressure and Its Applications

Introduction: Ultra-Fast Response of Ultra-Thin Materials on Solid Surfaces

Springer Series in Optical Sciences - Frontiers in Optical Methods
Latest Publications