2007 IEEE Workshop on Microelectronics and Electron Devices
Latest Publications

TOTAL DOCUMENTS

42

(FIVE YEARS 0)

H-INDEX

2

(FIVE YEARS 0)

Published By IEEE

1424411130, 1424411149

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Poster Presentation 4 : The Influence of Deposition Method on the Morphology of Thin Films of TCNQ for Potential Application as Ion-Conducting Memory

2007 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2007.368065 ◽

2007 ◽

Author(s):

Becky Munoz ◽

Kris Campbell

Keyword(s):

Poster Presentation ◽

Potential Application ◽

Deposition Method ◽

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Poster Presentation 6: Logic Circuits Operating in Both Sub- and Above-Threshold Voltages

2007 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2007.368067 ◽

2007 ◽

Author(s):

Jabulani Nyathi ◽

Brent Bero

Keyword(s):

Poster Presentation ◽

Logic Circuits ◽

Threshold Voltages

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Poster Presentation 5 : Image Quality Assessment Error Visibility Using Gradual Modulation Statistics

2007 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2007.368066 ◽

2007 ◽

Author(s):

Vinesh Sukumar ◽

Doug Warner ◽

Patrick Doherty ◽

Herbert Hess ◽

Ken Noren ◽

...

Keyword(s):

Image Quality ◽

Quality Assessment ◽

Poster Presentation ◽

Image Quality Assessment

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A High Sensitivity MEMS Pressure Sensor

2007 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2007.368060 ◽

2007 ◽

Author(s):

Jesse Law ◽

Ahsan Mian

Keyword(s):

Pressure Sensor ◽

High Sensitivity

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A Silicon-on-Insulator Transistor Resistant to Substrate Potential

2007 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2007.368049 ◽

2007 ◽

Author(s):

A. Oblea ◽

R. Hayhurst ◽

D. Wilson ◽

D. Hackler

Keyword(s):

Silicon On Insulator ◽

Substrate Potential

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Modeling the stress-induced leakage current origin from antisite defects in MOSFETs

2007 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2007.368050 ◽

2007 ◽

Author(s):

L.F. Mao

Keyword(s):

Leakage Current ◽

Antisite Defects ◽

Stress Induced Leakage Current

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On the Nature of Self-Assembled Collagen Fibrils as Biomolecular Nanowires for Sensor Applications

2007 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2007.368059 ◽

2007 ◽

Author(s):

D. Araujo ◽

P. Price ◽

J. Brotherton ◽

K. Coonse ◽

R. G. Southwick ◽

...

Keyword(s):

Collagen Fibrils ◽

Sensor Applications ◽

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Invited Speaker: Dr. M. Jamal Deen [Noise Issues in CMOS Devices and Circuits]

2007 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2007.368829 ◽

2007 ◽

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Poster Presentation 2 : Phase Change Memory Devices with Stacked Ge-Chalcogenide/Sn-Chalcogenide Films

2007 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2007.368063 ◽

2007 ◽

Author(s):

Christopher M. Anderson ◽

Kris Campbell

Keyword(s):

Phase Change ◽

Poster Presentation ◽

Phase Change Memory ◽

Memory Devices ◽

Chalcogenide Films ◽

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Subthreshold Leakage Due to 1/F Noise and Rts(Random Telegraph Signals)

2007 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2007.368840 ◽

2007 ◽

Author(s):

Drake A. Miller ◽

Panupat Poocharoen ◽

Leonard Forbes

Keyword(s):

Random Telegraph Signals ◽

Subthreshold Leakage

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