2008 International Conference on Microelectronics
Latest Publications

TOTAL DOCUMENTS

120

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781424423699

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

CAD models of the input admittance of RC wires: Comparison and selection strategies

2008 International Conference on Microelectronics ◽

10.1109/icm.2008.5393515 ◽

2008 ◽

Author(s):

Massimo Alioto

Keyword(s):

Input Admittance ◽

Selection Strategies ◽

Cad Models

Download Full-text

An area optimized implementation of the Advanced Encryption Standard

2008 International Conference on Microelectronics ◽

10.1109/icm.2008.5393805 ◽

2008 ◽

Cited By ~ 1

Author(s):

Abdel Alim Kamal ◽

Amr M. Youssef

Keyword(s):

Advanced Encryption Standard

Download Full-text

Decoupling capacitor optimization for nanotechnology designs

2008 International Conference on Microelectronics ◽

10.1109/icm.2008.5393765 ◽

2008 ◽

Cited By ~ 3

Author(s):

Bardia Bozorgzadeh ◽

Ali Afzali-Kusha

Keyword(s):

Decoupling Capacitor

Download Full-text

Gate level static power estimation in UDSM processes

2008 International Conference on Microelectronics ◽

10.1109/icm.2008.5393838 ◽

2008 ◽

Cited By ~ 1

Author(s):

Hussam Al-Hertani ◽

Dhamin Al-Khalili ◽

Come Rozon

Keyword(s):

Power Estimation ◽

Static Power

Download Full-text

Time evolution of the voltage-controlled signal in charge pump PLL applications

2008 International Conference on Microelectronics ◽

10.1109/icm.2008.5393824 ◽

2008 ◽

Author(s):

Sinisa Milicevic ◽

Leonard MacEachern

Keyword(s):

Time Evolution ◽

Charge Pump ◽

Charge Pump Pll

Download Full-text

On the energy efficiency of analog circuits in nanoscale CMOS technologies

2008 International Conference on Microelectronics ◽

10.1109/icm.2008.5393828 ◽

2008 ◽

Cited By ~ 2

Author(s):

Trond Ytterdal ◽

Carsten Wulff

Keyword(s):

Energy Efficiency ◽

Analog Circuits ◽

Nanoscale Cmos

Download Full-text

Bit-error-rate performance of inter-chip RF/wireless interconnect systems

2008 International Conference on Microelectronics ◽

10.1109/icm.2008.5393539 ◽

2008 ◽

Cited By ~ 2

Author(s):

Md. Sajjad Rahaman ◽

Masud H Chowdhury

Keyword(s):

Bit Error Rate ◽

Error Rate ◽

Rate Performance ◽

Wireless Interconnect ◽

Rf Wireless ◽

Interconnect Systems

Download Full-text

On the compensation of frequency-response mismatch errors in time-interleaved ADCs

2008 International Conference on Microelectronics ◽

10.1109/icm.2008.5393837 ◽

2008 ◽

Author(s):

Hakan Johansson

Keyword(s):

Frequency Response ◽

Time Interleaved

Download Full-text

Low-power high-performance logic style for low-voltage CMOS technologies

2008 International Conference on Microelectronics ◽

10.1109/icm.2008.5393525 ◽

2008 ◽

Author(s):

Bardia Bozorgzadeh ◽

Ehsan Zhian-Tabasy ◽

Ali Afzali-Kusha

Keyword(s):

Low Power ◽

High Performance ◽

Low Voltage

Download Full-text

Custom formal verification technique for partial product reduction tree

2008 International Conference on Microelectronics ◽

10.1109/icm.2008.5393541 ◽

2008 ◽

Author(s):

Marco Castellano ◽

Paola Baldrighi ◽

Carla Vacchi ◽

Mauro Natuzzi ◽

Alberto Furlan

Keyword(s):

Formal Verification ◽

Partial Product

Download Full-text

2008 International Conference on MicroelectronicsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

CAD models of the input admittance of RC wires: Comparison and selection strategies

An area optimized implementation of the Advanced Encryption Standard

Decoupling capacitor optimization for nanotechnology designs

Gate level static power estimation in UDSM processes

Time evolution of the voltage-controlled signal in charge pump PLL applications

On the energy efficiency of analog circuits in nanoscale CMOS technologies

Bit-error-rate performance of inter-chip RF/wireless interconnect systems

On the compensation of frequency-response mismatch errors in time-interleaved ADCs

Low-power high-performance logic style for low-voltage CMOS technologies

Custom formal verification technique for partial product reduction tree

2008 International Conference on Microelectronics
Latest Publications