2013 IEEE International Conference on Solid Dielectrics (ICSD)
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260

(FIVE YEARS 0)

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10

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Published By IEEE

9781467344616, 9781479908073

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Influence of water content and temperature on conduction and field on an Alumina/epoxy insulator

2013 IEEE International Conference on Solid Dielectrics (ICSD) ◽

10.1109/icsd.2013.6619898 ◽

2013 ◽

Author(s):

L. Zavattoni ◽

O. Lesaint ◽

O. Gallot-Lavallee ◽

J. L. Reboud

Keyword(s):

Water Content ◽

Influence Of Water

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Space charge accumulation in XLPE insulation at high temperature and water content

2013 IEEE International Conference on Solid Dielectrics (ICSD) ◽

10.1109/icsd.2013.6619756 ◽

2013 ◽

Author(s):

Torbjorn Andersen Ve ◽

Frank Mauseth ◽

Erling Ildstad

Keyword(s):

High Temperature ◽

Space Charge ◽

Water Content ◽

Charge Accumulation ◽

Xlpe Insulation

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Test cell for interfacial electric strength testing

2013 IEEE International Conference on Solid Dielectrics (ICSD) ◽

10.1109/icsd.2013.6619857 ◽

2013 ◽

Author(s):

Cecilia Forssen ◽

Anna Christerson

Keyword(s):

Test Cell ◽

Electric Strength ◽

Strength Testing

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Self-healing phenomenon of water tree in the process of the accelerated aging of XLPE cables

2013 IEEE International Conference on Solid Dielectrics (ICSD) ◽

10.1109/icsd.2013.6619909 ◽

2013 ◽

Author(s):

Kai Zhou ◽

Wei Zhao ◽

Wenbiao Tao

Keyword(s):

Accelerated Aging ◽

Self Healing ◽

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Space charge accumulation characteristics in multilayered polyimide films under DC high stress

2013 IEEE International Conference on Solid Dielectrics (ICSD) ◽

10.1109/icsd.2013.6619810 ◽

2013 ◽

Author(s):

Shohei Kawano ◽

Kyohei Ishikawa ◽

Hiroaki Miyake ◽

Yasuhiro Tanaka

Keyword(s):

Space Charge ◽

High Stress ◽

Charge Accumulation ◽

Polyimide Films ◽

Accumulation Characteristics

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Characterization and robustness of HVDC insulation

2013 IEEE International Conference on Solid Dielectrics (ICSD) ◽

10.1109/icsd.2013.6619804 ◽

2013 ◽

Author(s):

Thomas Christen

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Identifying prognostic indicators for electrical treeing in solid insulation through PD analysis

2013 IEEE International Conference on Solid Dielectrics (ICSD) ◽

10.1109/icsd.2013.6619720 ◽

2013 ◽

Author(s):

N. H. Aziz ◽

M. D. Judd ◽

V. M. Catterson

Keyword(s):

Prognostic Indicators ◽

Electrical Treeing ◽

Solid Insulation

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The impact of the colorants on the aging properties of HTV silicone rubber

2013 IEEE International Conference on Solid Dielectrics (ICSD) ◽

10.1109/icsd.2013.6619733 ◽

2013 ◽

Author(s):

Congzhen Xie ◽

Shan Liu ◽

Haiqing Niu ◽

Licheng Li

Keyword(s):

Silicone Rubber ◽

Aging Properties ◽

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Description and experimental validation of a new PEA signal processing concept

2013 IEEE International Conference on Solid Dielectrics (ICSD) ◽

10.1109/icsd.2013.6619766 ◽

2013 ◽

Author(s):

M. Arnaout ◽

T. Paulmier ◽

B. Dirasen ◽

L. Berquez ◽

F. Baudoin ◽

...

Keyword(s):

Signal Processing ◽

Experimental Validation

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Conduction currents in fluorinated parylene PA-HT at high temperature

2013 IEEE International Conference on Solid Dielectrics (ICSD) ◽

10.1109/icsd.2013.6619668 ◽

2013 ◽

Author(s):

R. Khazaka ◽

M. L. Locatelli ◽

S. Diaham ◽

M. Bechara ◽

H. Hourdequin ◽

...

Keyword(s):

High Temperature

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