Impact of Electron and Scanning Probe Microscopy on Materials Research
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Published By Springer Netherlands

9780792359401, 9789401144513

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Environmental SEM and Related Applications

Impact of Electron and Scanning Probe Microscopy on Materials Research ◽

10.1007/978-94-011-4451-3_17 ◽

1999 ◽

pp. 387-396

Author(s):

Thomas A. Hardt

Keyword(s):

Environmental Sem

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Nanostructured Materials

Impact of Electron and Scanning Probe Microscopy on Materials Research ◽

10.1007/978-94-011-4451-3_3 ◽

1999 ◽

pp. 41-61

Author(s):

Virgil Provenzano

Keyword(s):

Nanostructured Materials

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Electron Energy Loss Spectrometry in the Electron Microscope

Impact of Electron and Scanning Probe Microscopy on Materials Research ◽

10.1007/978-94-011-4451-3_8 ◽

1999 ◽

pp. 209-230 ◽

Cited By ~ 1

Author(s):

L. M. Brown

Keyword(s):

Electron Microscope ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectrometry ◽

Electron Energy Loss

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Environmental SEM and Related Applications

Impact of Electron and Scanning Probe Microscopy on Materials Research ◽

10.1007/978-94-011-4451-3_18 ◽

1999 ◽

pp. 397-406

Author(s):

Thomas A. Hardt

Keyword(s):

Environmental Sem

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New Developments in Scanning Probe Microscopy

Impact of Electron and Scanning Probe Microscopy on Materials Research ◽

10.1007/978-94-011-4451-3_14 ◽

1999 ◽

pp. 339-357

Author(s):

E. Meyer ◽

M. Guggisberg ◽

Ch. Loppacher ◽

F. Battiston ◽

T. Gyalog ◽

...

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

New Developments ◽

Probe Microscopy

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Convergent Beam Electron Diffraction

Impact of Electron and Scanning Probe Microscopy on Materials Research ◽

10.1007/978-94-011-4451-3_13 ◽

1999 ◽

pp. 325-337 ◽

Cited By ~ 1

Author(s):

Colin J. Humphreys

Keyword(s):

Electron Diffraction ◽

Convergent Beam Electron Diffraction ◽

Beam Electron ◽

Convergent Beam

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Application of Low Voltage Scanning Electron Microscopy and Energy Dispersive X-Ray Spectroscopy

Impact of Electron and Scanning Probe Microscopy on Materials Research ◽

10.1007/978-94-011-4451-3_16 ◽

1999 ◽

pp. 367-385 ◽

Cited By ~ 2

Author(s):

D. G. Rickerby

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Low Voltage ◽

Energy Dispersive ◽

X Ray ◽

Voltage Scanning ◽

Scanning Electron

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Characterization of Heterophase Transformation Interfaces by High-Resolution Transmission Electron Microscope Techniques

Impact of Electron and Scanning Probe Microscopy on Materials Research ◽

10.1007/978-94-011-4451-3_4 ◽

1999 ◽

pp. 63-108 ◽

Cited By ~ 1

Author(s):

J. M. Howe

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

Transmission Electron

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Correlative Microscopy and Probing in Materials Science

Impact of Electron and Scanning Probe Microscopy on Materials Research ◽

10.1007/978-94-011-4451-3_22 ◽

1999 ◽

pp. 455-472

Author(s):

Giovanni Valdre’

Keyword(s):

Materials Science ◽

Correlative Microscopy

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Microstructural Design and Tailoring of Advanced Materials

Impact of Electron and Scanning Probe Microscopy on Materials Research ◽

10.1007/978-94-011-4451-3_2 ◽

1999 ◽

pp. 25-40

Author(s):

Gareth Thomas

Keyword(s):

Advanced Materials ◽

Microstructural Design

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Impact of Electron and Scanning Probe Microscopy on Materials ResearchLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Netherlands

Environmental SEM and Related Applications

Nanostructured Materials

Electron Energy Loss Spectrometry in the Electron Microscope

Environmental SEM and Related Applications

New Developments in Scanning Probe Microscopy

Convergent Beam Electron Diffraction

Application of Low Voltage Scanning Electron Microscopy and Energy Dispersive X-Ray Spectroscopy

Characterization of Heterophase Transformation Interfaces by High-Resolution Transmission Electron Microscope Techniques

Correlative Microscopy and Probing in Materials Science

Microstructural Design and Tailoring of Advanced Materials

Impact of Electron and Scanning Probe Microscopy on Materials Research
Latest Publications