2010 IEEE International Reliability Physics Symposium
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9781424454303
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Study of leakage mechanism and trap density in porous low-k materials

2010 ◽  
Author(s):  
Gianni Giai Gischia ◽  
Kristof Croes ◽  
Guido Groeseneken ◽  
Zsolt Tokei ◽  
Valery Afanas'ev ◽  
...  
Keyword(s):  
Trap Density ◽  
Leakage Mechanism ◽  
Low K

Comparison of two calibration methods for a package stress measurement testchip

2010 ◽  
Author(s):  
Christian Djelassi ◽  
Helmut Kock ◽  
Michael Glavanovics
Keyword(s):  
Stress Measurement ◽  
Calibration Methods

A compact analytic model for the breakdown distribution of gate stack dielectrics

2010 ◽  
Author(s):  
Santi Tous ◽  
Ernest Y. Wu ◽  
Jordi Sune
Keyword(s):  
Analytic Model ◽  
Gate Stack

LEAP: Layout Design through Error-Aware Transistor Positioning for soft-error resilient sequential cell design

2010 ◽  
Author(s):  
Hsiao-Heng Kelin Lee ◽  
Lilja Klas ◽  
Bounasser Mounaim ◽  
Relangi Prasanthi ◽  
Ivan R. Linscott ◽  
...  
Keyword(s):  
Layout Design ◽  
Soft Error ◽  
Cell Design ◽  
Error Resilient

scholarly journals Analysis of the relationship between random telegraph signal and negative bias temperature instability

2010 ◽  
Author(s):  
Yasumasa Tsukamoto ◽  
Seng Oon Toh ◽  
Changhwan Shin ◽  
Andrew Mairena ◽  
Tsu-Jae King Liu ◽  
...  
Keyword(s):  
Negative Bias ◽  
Negative Bias Temperature Instability ◽  
Temperature Instability ◽  
Random Telegraph Signal ◽  
Bias Temperature Instability ◽  
The Relationship

Reliability aspects of organic light emitting diodes

2010 ◽  
Author(s):  
Thomas Riedl ◽  
Thomas Winkler ◽  
Hans Schmidt ◽  
Jens Meyer ◽  
Daniel Schneidenbach ◽  
...  
Keyword(s):  
Light Emitting Diodes ◽  
Organic Light Emitting Diodes ◽  
Light Emitting ◽  
Organic Light

Degradation and failure analysis of copper and tungsten contacts under high fluence stress

2010 ◽  
Author(s):  
Thomas Kauerauf ◽  
Geni Butera ◽  
Kristof Croes ◽  
Steven Demuynck ◽  
Christopher J. Wilson ◽  
...  
Keyword(s):  
Failure Analysis ◽  
High Fluence ◽  
And Tungsten
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