2008 9th International Workshop and Tutorials on Electron Devices and Materials
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

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Published By IEEE

9785778208933

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Effect of substrate-drop parameters on nanowhiskers morphology

2008 9th International Workshop and Tutorials on Electron Devices and Materials ◽

10.1109/sibedm.2008.4585841 ◽

2008 ◽

Cited By ~ 2

Author(s):

Alla G. Nastovjak ◽

Igor G. Neizvestny ◽

Nataliya L. Shwartz ◽

Evgeniya S. Sheremet ◽

Zoya Sh. Yanovitskaja

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Development of multizone radiator and their application at flowing through viscous liquids

2008 9th International Workshop and Tutorials on Electron Devices and Materials ◽

10.1109/sibedm.2008.4585907 ◽

2008 ◽

Cited By ~ 1

Author(s):

Sergey N. Tsyganok ◽

Sergey S. Khmelev ◽

Denis S. Abramenko ◽

Sergey V. Levin

Keyword(s):

Viscous Liquids

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Monte Carlo simulation of initial stages of Si (111) Oxidation by O2 near critical conditions

2008 9th International Workshop and Tutorials on Electron Devices and Materials ◽

10.1109/sibedm.2008.4585846 ◽

2008 ◽

Author(s):

Nadezhda A. Gladkikh ◽

Nataliya L. Shwartz ◽

Zoya Sh.Yanovitskaja

Keyword(s):

Monte Carlo Simulation ◽

Monte Carlo ◽

Critical Conditions

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Investigation of generation process in narrowband MIS structures

2008 9th International Workshop and Tutorials on Electron Devices and Materials ◽

10.1109/sibedm.2008.4585872 ◽

2008 ◽

Author(s):

Artem E. Nastovjak ◽

Vladimir G. Polovinkin

Keyword(s):

Generation Process ◽

Mis Structures

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Prediction of forbidden band gap of oxide crystal by chemical formula

2008 9th International Workshop and Tutorials on Electron Devices and Materials ◽

10.1109/sibedm.2008.4585851 ◽

2008 ◽

Cited By ~ 3

Author(s):

Anton S. Korotkov ◽

Viktor V. Atuchin

Keyword(s):

Band Gap ◽

Chemical Formula ◽

Oxide Crystal

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Effect of magnetic field on the current-voltage characteristics of PbSnTe:In films

2008 9th International Workshop and Tutorials on Electron Devices and Materials ◽

10.1109/sibedm.2008.4585874 ◽

2008 ◽

Author(s):

Vladimir S. Epov ◽

Alexander E. Klimov ◽

Vladimir N. Shumsky

Keyword(s):

Magnetic Field ◽

Current Voltage ◽

Current Voltage Characteristics

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Test bench for flow cavitational processing of liquid media

2008 9th International Workshop and Tutorials on Electron Devices and Materials ◽

10.1109/sibedm.2008.4585921 ◽

2008 ◽

Author(s):

Vladimir N. Khmelev ◽

Andrey V. Shalunov ◽

Yuriy M. Kuzovnikov ◽

Sergey N. Tsyganok ◽

Sergey S. Khmelev

Keyword(s):

Test Bench ◽

Liquid Media

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Silicon thermal oxidation models comparison used in TCAD Sentaurus process and fact

2008 9th International Workshop and Tutorials on Electron Devices and Materials ◽

10.1109/sibedm.2008.4585855 ◽

2008 ◽

Author(s):

Dmitry O. Kuznetsov

Keyword(s):

Thermal Oxidation ◽

Models Comparison ◽

Tcad Sentaurus

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Calculation of key parameters of installation of microwave dielectric heating

2008 9th International Workshop and Tutorials on Electron Devices and Materials ◽

10.1109/sibedm.2008.4585877 ◽

2008 ◽

Cited By ~ 2

Author(s):

Vadim V. Tilzo ◽

Gennady V. Leonov

Keyword(s):

Dielectric Heating ◽

Microwave Dielectric ◽

Microwave Dielectric Heating

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Model for building the data transmission system HARQ-CCC in environment simulink

2008 9th International Workshop and Tutorials on Electron Devices and Materials ◽

10.1109/sibedm.2008.4585880 ◽

2008 ◽

Author(s):

Alexey Shapin

Keyword(s):

Data Transmission ◽

Transmission System ◽

Data Transmission System

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2008 9th International Workshop and Tutorials on Electron Devices and MaterialsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Effect of substrate-drop parameters on nanowhiskers morphology

Development of multizone radiator and their application at flowing through viscous liquids

Monte Carlo simulation of initial stages of Si (111) Oxidation by O2 near critical conditions

Investigation of generation process in narrowband MIS structures

Prediction of forbidden band gap of oxide crystal by chemical formula

Effect of magnetic field on the current-voltage characteristics of PbSnTe:In films

Test bench for flow cavitational processing of liquid media

Silicon thermal oxidation models comparison used in TCAD Sentaurus process and fact

Calculation of key parameters of installation of microwave dielectric heating

Model for building the data transmission system HARQ-CCC in environment simulink

2008 9th International Workshop and Tutorials on Electron Devices and Materials
Latest Publications