2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486)
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A new analytical design approach for membrane supported band-pass filters

2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) ◽

10.1109/smicnd.2000.890225 ◽

2002 ◽

Author(s):

G. Bartolucci ◽

D. Neculoiu ◽

M. Dragoman ◽

R. Marcelli ◽

A. Muller

Keyword(s):

Design Approach ◽

Analytical Design ◽

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Behavioral synthesis at the device level

2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) ◽

10.1109/smicnd.2000.890222 ◽

2002 ◽

Author(s):

A. Manolescu ◽

A.M. Manolescu

Keyword(s):

Behavioral Synthesis

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Using spectroellipsometry to examine multilayer gratings for sensors and photodetectors

2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) ◽

10.1109/smicnd.2000.889117 ◽

2002 ◽

Author(s):

N.L. Dmitruk ◽

O.I. Mayeva ◽

S.V. Mamykin ◽

O.B. Yastrubchak ◽

M. Klopfleisch

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New versatile and easy selective boron diffusion

2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) ◽

10.1109/smicnd.2000.890208 ◽

2002 ◽

Author(s):

C. Liiceanu ◽

M. Niculae ◽

M. Rauta

Keyword(s):

Boron Diffusion

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Conduction via deep levels in hydrogen plasma treated Au-Si Schottky structures

2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) ◽

10.1109/smicnd.2000.890207 ◽

2002 ◽

Author(s):

S. Simeonov ◽

E. Kafedjiiska ◽

A. Szekeres

Keyword(s):

Hydrogen Plasma ◽

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Microphysical characterization and residual stress analysts of thin polyimide membranes on GaAs substrate, support for micromachined structures

2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) ◽

10.1109/smicnd.2000.889130 ◽

2002 ◽

Author(s):

I. Petrini ◽

A. Muller ◽

S. Iordanescu ◽

D. Vasilache ◽

G. Constantinidis ◽

...

Keyword(s):

Residual Stress ◽

Gaas Substrate ◽

Substrate Support ◽

Polyimide Membranes

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A 150 mA LDO in 0.8 μm CMOS process

2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) ◽

10.1109/smicnd.2000.890192 ◽

2002 ◽

Author(s):

C. Stanescu

Keyword(s):

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Low-power oriented microcontroller architecture

2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) ◽

10.1109/smicnd.2000.890221 ◽

2002 ◽

Author(s):

B. Mitu ◽

G. Stefan

Keyword(s):

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Deep level transient spectroscopy characterization of porous GaP layers

2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) ◽

10.1109/smicnd.2000.890204 ◽

2002 ◽

Author(s):

M. Calin

Keyword(s):

Deep Level Transient Spectroscopy ◽

Transient Spectroscopy

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Simulation study of a novel current limiting device: a vertical 6H-SiC etched AccuJFET

2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) ◽

10.1109/smicnd.2000.890218 ◽

2002 ◽

Author(s):

D. Tournier ◽

D. Planson ◽

P. Godigon ◽

M.L. Locatelli ◽

J.P. Chante ◽

...

Keyword(s):

Simulation Study ◽

Current Limiting

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