ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures
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51

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0780308573

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High-voltage termination-structure design using a test chip and two-dimensional simulation

ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1993.292896 ◽

2002 ◽

Author(s):

R.D. Schrimpf ◽

S.I. Kosier ◽

B. Salik ◽

K.F. Galloway ◽

C.F. Wheatley ◽

...

Keyword(s):

High Voltage ◽

Structure Design ◽

Two Dimensional ◽

Test Chip ◽

Dimensional Simulation

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Direct extraction of SPICE level 3 parameters without using optimization

ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1993.292902 ◽

2002 ◽

Author(s):

J.-i. Matsuda

Keyword(s):

Direct Extraction ◽

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Junction evaluation by time dependent degradation due to high constant voltage stressing (DRAMs)

ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1993.292883 ◽

2002 ◽

Author(s):

J. Mitsuhashi ◽

J. Komori ◽

T. Eimori ◽

H. Koyama

Keyword(s):

Time Dependent ◽

Constant Voltage

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An implementation of CMOS design for testability techniques for non stuck-at faults

ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1993.292887 ◽

2002 ◽

Author(s):

M. Lanzoni ◽

M. Favalli ◽

P. Olivo ◽

B. Ricco

Keyword(s):

Design For Testability ◽

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A low frequency AC method to measure the doping profile in the channel region of a MOSFET with general extendability to the semiconductor surface

ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1993.292880 ◽

2002 ◽

Author(s):

J.D. Kendall ◽

J.K. Kolk ◽

A.R. Boothroyd ◽

D.A. Vincent

Keyword(s):

Low Frequency ◽

Doping Profile ◽

Semiconductor Surface ◽

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A methodology for pre-determination of bipolar SPICE model parameters in BiCMOS technology

ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1993.292900 ◽

2002 ◽

Author(s):

S. Aggarwal ◽

A. Juge

Keyword(s):

Model Parameters ◽

Spice Model ◽

Bicmos Technology

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Modeling and characterization of MOSFET width dependencies

ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1993.292881 ◽

2002 ◽

Author(s):

R.A. Ashton ◽

P.A. Layman ◽

C.C. McAndrew

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Evaluations of leakage currents and capacitances on elementary CMOS devices

ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1993.292905 ◽

2002 ◽

Author(s):

P. Girard ◽

P. Nouet ◽

A. Khalkhal ◽

F.M. Roche

Keyword(s):

Leakage Currents

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Evaluation of metallization systems with test structures and yield modeling

ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1993.292891 ◽

2002 ◽

Author(s):

C.A. DeLoach ◽

H.G. Parks ◽

S.E. Beck

Keyword(s):

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Design considerations for a test structure which can be used to determine the optimum focus

ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1993.292907 ◽

2002 ◽

Author(s):

A.J. Walton ◽

M. Fallon ◽

J.T.M. Stevenson ◽

A.W.S. Ross

Keyword(s):

Test Structure ◽

Design Considerations

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