2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI)
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781538622995

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Analysis of PSIJ in the presence of both ground-bounce and transmission media

2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI) ◽

10.1109/sapiw.2018.8401651 ◽

2018 ◽

Author(s):

Jai Narayan Tripathi ◽

Amit Jain ◽

Mate Marinkovic ◽

Ramachandra Achar

Keyword(s):

Ground Bounce

Download Full-text

Power integrity challenges of re-designing a mobile SoC with fully integrated voltage regulator to IoT applications

2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI) ◽

10.1109/sapiw.2018.8401654 ◽

2018 ◽

Cited By ~ 1

Author(s):

Yan Fen Shen

Keyword(s):

Voltage Regulator ◽

Power Integrity ◽

Fully Integrated ◽

Iot Applications ◽

Mobile Soc

Download Full-text

Miniaturized wide- and dual-band multilayer electromagnetic bandgap for antenna isolation and on-package/PCB noise suppression

2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI) ◽

10.1109/sapiw.2018.8401663 ◽

2018 ◽

Author(s):

Petros Bantavis ◽

Marc Le Roy ◽

Andre Perennec ◽

Raafat Lababidi ◽

Denis Le jeune

Keyword(s):

Noise Suppression ◽

Dual Band ◽

Electromagnetic Bandgap

Download Full-text

A machine learning methodology for inferring network S-parameters in the presence of variability

2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI) ◽

10.1109/sapiw.2018.8401643 ◽

2018 ◽

Cited By ~ 1

Author(s):

Xiao Ma ◽

Maxim Raginsky ◽

Andreas C. Cangellaris

Keyword(s):

Machine Learning ◽

S Parameters

Download Full-text

Modeling of eye diagram height in high-speed links via support vector machine

2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI) ◽

10.1109/sapiw.2018.8401679 ◽

2018 ◽

Cited By ~ 6

Author(s):

R. Trinchero ◽

F. G. Canavero

Keyword(s):

Support Vector Machine ◽

High Speed ◽

Support Vector ◽

Eye Diagram

Download Full-text

Evaluation and comparison of mounted inductance for decoupling capacitor

2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI) ◽

10.1109/sapiw.2018.8401647 ◽

2018 ◽

Author(s):

Benoit Goral ◽

Cyrille Gautier ◽

Alexandre Amedeo

Keyword(s):

Decoupling Capacitor

Download Full-text

Cover page

2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI) ◽

10.1109/sapiw.2018.8401681 ◽

2018 ◽

Download Full-text

An eye diagram improvement method using simulation annealing algorithm

2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI) ◽

10.1109/sapiw.2018.8401667 ◽

2018 ◽

Author(s):

Po-Jui Li ◽

Tzong-Lin Wu

Keyword(s):

Eye Diagram ◽

Improvement Method ◽

Annealing Algorithm

Download Full-text

Technical program: Oral papers

2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI) ◽

10.1109/sapiw.2018.8401684 ◽

2018 ◽

Keyword(s):

Technical Program

Download Full-text

Reduced-order model for time-domain sensitivity analysis of active circuits

2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI) ◽

10.1109/sapiw.2018.8401675 ◽

2018 ◽

Cited By ~ 1

Author(s):

Behzad Nouri ◽

Michel Nakhla

Keyword(s):

Sensitivity Analysis ◽

Time Domain ◽

Reduced Order Model ◽

Order Model ◽

Reduced Order ◽

Active Circuits

Download Full-text

2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Analysis of PSIJ in the presence of both ground-bounce and transmission media

Power integrity challenges of re-designing a mobile SoC with fully integrated voltage regulator to IoT applications

Miniaturized wide- and dual-band multilayer electromagnetic bandgap for antenna isolation and on-package/PCB noise suppression

A machine learning methodology for inferring network S-parameters in the presence of variability

Modeling of eye diagram height in high-speed links via support vector machine

Evaluation and comparison of mounted inductance for decoupling capacitor

Cover page

An eye diagram improvement method using simulation annealing algorithm

Technical program: Oral papers

Reduced-order model for time-domain sensitivity analysis of active circuits

2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI)
Latest Publications