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Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium
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TOTAL DOCUMENTS
30
(FIVE YEARS 0)
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9
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Published By IEEE
078033793x
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Experimental Methods in Air Cooling of Electronics
Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium
◽
10.1109/stherm.1997.566776
◽
2005
◽
Cited By ~ 1
Author(s):
R.J. Moffat
◽
A. Ortega
Keyword(s):
Experimental Methods
◽
Air Cooling
◽
Cooling Of Electronics
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1997 Cumulative Bibliography of Articles on Semiconductor Thermal Measurement, Management and Modeling
Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium
◽
10.1109/stherm.1997.566804
◽
2005
◽
Author(s):
B.S. Siegal
Keyword(s):
Thermal Measurement
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Pressure drop and heat transfer in an isothermal channel with impinging flow
Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium
◽
10.1109/stherm.1997.566800
◽
2002
◽
Cited By ~ 2
Author(s):
C.R. Biber
Keyword(s):
Heat Transfer
◽
Pressure Drop
◽
Impinging Flow
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Recent achievements in the thermal characterization of electronic devices by means of boundary condition independent compact models
Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium
◽
10.1109/stherm.1997.566780
◽
2002
◽
Cited By ~ 14
Author(s):
H. Vinke
◽
C.J.M. Lasance
Keyword(s):
Boundary Condition
◽
Electronic Devices
◽
Thermal Characterization
◽
Compact Models
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Multiobjective optimization of component placement on planar printed wiring boards
Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium
◽
10.1109/stherm.1997.566786
◽
2002
◽
Cited By ~ 1
Author(s):
N.V. Queipo
◽
G.F. Gil
Keyword(s):
Multiobjective Optimization
◽
Printed Wiring Boards
◽
Component Placement
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Compact air-cooled heat sinks for power packages
Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium
◽
10.1109/stherm.1997.566794
◽
2002
◽
Cited By ~ 2
Author(s):
A. Aranyosi
◽
L. Bolle
◽
H. Buyse
Keyword(s):
Heat Sinks
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Comparison of diodes and resistors for measuring chip temperature during thermal characterization of electronic packages using thermal test chips
Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium
◽
10.1109/stherm.1997.566797
◽
2002
◽
Cited By ~ 14
Author(s):
A. Claassen
◽
H. Shaukatullah
Keyword(s):
Thermal Characterization
◽
Electronic Packages
◽
Chip Temperature
◽
Thermal Test
◽
Test Chips
Download Full-text
Hinged heat pipes for cooling notebook PCs
Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium
◽
10.1109/stherm.1997.566784
◽
2002
◽
Author(s):
M. Mochizuki
◽
Y. Saito
◽
K. Goto
◽
T. Nguyen
◽
Phong Ho
◽
...
Keyword(s):
Heat Pipes
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High power multichip modules employing the planar embedding technique and microchannel water heat sinks
Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium
◽
10.1109/stherm.1997.566782
◽
2002
◽
Cited By ~ 3
Author(s):
R. Hahn
◽
A. Kamp
◽
A. Ginolas
◽
M. Schmidt
◽
J. Wolf
◽
...
Keyword(s):
High Power
◽
Heat Sinks
◽
Multichip Modules
◽
Planar Embedding
◽
Embedding Technique
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Transient thermal study of laser diodes
Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium
◽
10.1109/stherm.1997.566799
◽
2002
◽
Cited By ~ 2
Author(s):
C.C. Lee
◽
J.W. Lee
◽
D.H. Chien
◽
R. Shih
Keyword(s):
Laser Diodes
◽
Thermal Study
◽
Transient Thermal
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