In-Situ Microscopy in Materials Research
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13

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2

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Published By Springer US

9780792399896, 9781461562153

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In-situ REM and TEM Studies of Homo and Hetero-epitaxy on Si Surfaces

In-Situ Microscopy in Materials Research ◽

10.1007/978-1-4615-6215-3_9 ◽

1997 ◽

pp. 201-224 ◽

Author(s):

Hiroki Minoda ◽

Katsumichi Yagi

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Environmental High Resolution Electron Microscopy in Materials Science

In-Situ Microscopy in Materials Research ◽

10.1007/978-1-4615-6215-3_6 ◽

1997 ◽

pp. 123-147 ◽

Author(s):

Pratibha L. Gai ◽

Edward D. Boyes

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Materials Science ◽

High Resolution Electron Microscopy ◽

Resolution Electron

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Atomic-Scale Fabrication of Metal Surfaces by Using Adsorption and Chemical Reaction

In-Situ Microscopy in Materials Research ◽

10.1007/978-1-4615-6215-3_10 ◽

1997 ◽

pp. 225-261

Author(s):

Ken-ichi Tanaka ◽

Yuji Matsumoto ◽

Takaya Fujita ◽

Yuji Okawa

Keyword(s):

Chemical Reaction ◽

Metal Surfaces ◽

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Environmental Scanning Electron Microscopy

In-Situ Microscopy in Materials Research ◽

10.1007/978-1-4615-6215-3_2 ◽

1997 ◽

pp. 13-44 ◽

Author(s):

Gerasimos Daniel Danilatos

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Environmental Scanning Electron Microscopy ◽

Environmental Scanning ◽

Scanning Electron

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In-Situ Transmission Electron Microscopy of Thin Film Growth

In-Situ Microscopy in Materials Research ◽

10.1007/978-1-4615-6215-3_7 ◽

1997 ◽

pp. 149-171

Author(s):

J. Murray Gibson

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Film Growth ◽

Thin Film Growth ◽

Transmission Electron

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In-Situ Observation and Quantitative Analysis of Electromigration Void Dynamics

In-Situ Microscopy in Materials Research ◽

10.1007/978-1-4615-6215-3_5 ◽

1997 ◽

pp. 93-122

Author(s):

Richard Frankovic ◽

Gary H. Bernstein

Keyword(s):

Quantitative Analysis ◽

In Situ Observation ◽

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Tem Studies of Some Structurally Flexible Solids and Their Associated Phase Transformations

In-Situ Microscopy in Materials Research ◽

10.1007/978-1-4615-6215-3_13 ◽

1997 ◽

pp. 301-330

Author(s):

Ray L. Withers ◽

John G. Thompson

Keyword(s):

Phase Transformations

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Intrinsic Point Defect Clustering in Si: A Study by HVEM and HREM in Situ Electron Irradiation

In-Situ Microscopy in Materials Research ◽

10.1007/978-1-4615-6215-3_4 ◽

1997 ◽

pp. 63-92 ◽

Author(s):

Ludmila Fedina ◽

Anton Gutakovskii ◽

Alexander Aseev ◽

Joseph Van Landuyt ◽

Jan Vanhellemont

Keyword(s):

Point Defect ◽

Electron Irradiation ◽

Intrinsic Point Defect

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High Temperature Dynamic Behavior of Silicon Surfaces Studied by STM

In-Situ Microscopy in Materials Research ◽

10.1007/978-1-4615-6215-3_11 ◽

1997 ◽

pp. 263-282

Author(s):

Hiroshi Tokumoto

Keyword(s):

High Temperature ◽

Dynamic Behavior ◽

Silicon Surfaces ◽

Temperature Dynamic

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In-situ Applications of Low Energy Electron Microscopy

In-Situ Microscopy in Materials Research ◽

10.1007/978-1-4615-6215-3_1 ◽

1997 ◽

pp. 1-12

Author(s):

E. Bauer

Keyword(s):

Electron Microscopy ◽

Energy Electron ◽

Low Energy Electron

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