2006 European Solid-State Device Research Conference
Latest Publications

TOTAL DOCUMENTS

119

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

1424403014

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

One and Two Port Piezoelectric Contour-Mode MEMS Resonators for Frequency Synthesis

2006 European Solid-State Device Research Conference ◽

10.1109/essder.2006.307668 ◽

2006 ◽

Cited By ~ 5

Author(s):

Gianluca Piazza ◽

Philip J. Stephanou ◽

Albert P. Pisano

Keyword(s):

Frequency Synthesis ◽

Mems Resonators ◽

Contour Mode

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Local volume inversion and corner effects in triangular gate-all-around MOSFETs

2006 European Solid-State Device Research Conference ◽

10.1109/essder.2006.307712 ◽

2006 ◽

Cited By ~ 9

Author(s):

Kirsten Moselund ◽

Didier Bouvet ◽

Lucas Tschuor ◽

Vincent Pott ◽

Paolo Dainesi ◽

...

Keyword(s):

Local Volume ◽

Corner Effects

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Experimental Evidence for Reduction of Gate Tunneling Current in FinFET Structures and Its Dependence on the Fin Width

2006 European Solid-State Device Research Conference ◽

10.1109/essder.2006.307716 ◽

2006 ◽

Cited By ~ 2

Author(s):

Tamara Rudenko ◽

Alexey Nazarov ◽

Valeria Kilchytska ◽

Denis Flandre ◽

Nadine Collaert ◽

...

Keyword(s):

Experimental Evidence ◽

Tunneling Current ◽

Gate Tunneling

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A Study of the As-Processed and Generated Leakage Paths in Al2O3-Based Dielectric Stacks for Nonvolatile Memory Applications

2006 European Solid-State Device Research Conference ◽

10.1109/essder.2006.307724 ◽

2006 ◽

Author(s):

D. Aguado ◽

B. Govoreanu ◽

R. Degraeve ◽

J. Houdt ◽

K. Meyer

Keyword(s):

Nonvolatile Memory ◽

Memory Applications

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STI Effect on Flicker Noise in 0.13-μm RF NMOS

2006 European Solid-State Device Research Conference ◽

10.1109/essder.2006.307648 ◽

2006 ◽

Cited By ~ 3

Author(s):

Chih-yuan Chan ◽

Jun-de Jin ◽

Yu-syuan Lin ◽

Shawn S. H. Hsu ◽

Ying-zong Juang

Keyword(s):

Flicker Noise

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High Threshold Voltage Matching Performance on Gate-All-Around MOSFET

2006 European Solid-State Device Research Conference ◽

10.1109/essder.2006.307717 ◽

2006 ◽

Cited By ~ 4

Author(s):

Augustin Cathignol ◽

Antoine Cros ◽

Samuel Harrison ◽

Robin Cerrutti ◽

Philippe Coronel ◽

...

Keyword(s):

Threshold Voltage ◽

High Threshold ◽

Matching Performance

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CMOS Compatible Dual Metal Gate Integration with Successful Vth Adjustment on High-k HfTaON by High-Temperature Metal Intermixing

2006 European Solid-State Device Research Conference ◽

10.1109/essder.2006.307661 ◽

2006 ◽

Author(s):

C. Ren ◽

D. H. Chan ◽

W. Loh ◽

J. Peng ◽

S. Balakumar ◽

...

Keyword(s):

High Temperature ◽

Metal Gate ◽

High K ◽

Cmos Compatible ◽

Dual Metal

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A Novel Bias Temperature Instability Characterization Methodology for High-k MOSFETs

2006 European Solid-State Device Research Conference ◽

10.1109/essder.2006.307719 ◽

2006 ◽

Cited By ~ 5

Author(s):

Dawei Heh ◽

Gennadi Bersuker ◽

Rino Choi ◽

Chadwin Young ◽

Byoung Lee

Keyword(s):

Temperature Instability ◽

Bias Temperature Instability ◽

High K

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Retention Tail Improvement for Gbit DRAMs through Trap Passivation confirmed by Activation Energy Analysis

2006 European Solid-State Device Research Conference ◽

10.1109/essder.2006.307685 ◽

2006 ◽

Cited By ~ 1

Author(s):

A. Weber ◽

A. Birner ◽

W. Krautschneider

Keyword(s):

Activation Energy ◽

Energy Analysis

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Assessment of the Impact of Biaxial Strain on the Drain Current of Decanometric n-MOSFET

2006 European Solid-State Device Research Conference ◽

10.1109/essder.2006.307664 ◽

2006 ◽

Cited By ~ 5

Author(s):

D. Ponton ◽

L. Lucci ◽

P. Palestri ◽

D. Esseni ◽

L. Selmi

Keyword(s):

Drain Current ◽

Biaxial Strain ◽

The Impact

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2006 European Solid-State Device Research ConferenceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

One and Two Port Piezoelectric Contour-Mode MEMS Resonators for Frequency Synthesis

Local volume inversion and corner effects in triangular gate-all-around MOSFETs

Experimental Evidence for Reduction of Gate Tunneling Current in FinFET Structures and Its Dependence on the Fin Width

A Study of the As-Processed and Generated Leakage Paths in Al2O3-Based Dielectric Stacks for Nonvolatile Memory Applications

STI Effect on Flicker Noise in 0.13-μm RF NMOS

High Threshold Voltage Matching Performance on Gate-All-Around MOSFET

CMOS Compatible Dual Metal Gate Integration with Successful Vth Adjustment on High-k HfTaON by High-Temperature Metal Intermixing

A Novel Bias Temperature Instability Characterization Methodology for High-k MOSFETs

Retention Tail Improvement for Gbit DRAMs through Trap Passivation confirmed by Activation Energy Analysis

Assessment of the Impact of Biaxial Strain on the Drain Current of Decanometric n-MOSFET

2006 European Solid-State Device Research Conference
Latest Publications