Experimental Evidence for Reduction of Gate Tunneling Current in FinFET Structures and Its Dependence on the Fin Width
2003 ◽
Vol 50
(12)
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pp. 2579-2581
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2018 ◽
Vol 29
(18)
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pp. 15496-15501
Keyword(s):
Keyword(s):
2002 ◽
Vol 41
(Part 1, No. 4B)
◽
pp. 2348-2352
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2007 ◽
Vol 54
(10)
◽
pp. 2614-2622
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2005 ◽
Vol 26
(8)
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pp. 550-552
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