Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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On variable-shift-based fault compensation of fuzzy controllers

Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dftvs.2001.966797 ◽

2005 ◽

Author(s):

N. Kamiura ◽

M. Tomita ◽

T. Isokawa ◽

N. Matsui

Keyword(s):

Fuzzy Controllers ◽

Fault Compensation

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Novel approaches for fault detection in two-dimensional combinational arrays

Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dftvs.2001.966765 ◽

2002 ◽

Author(s):

X.T. Chen ◽

W.K. Huang ◽

N. Park ◽

F.J. Meyer ◽

F. Lombardi

Keyword(s):

Fault Detection ◽

Two Dimensional ◽

Novel Approaches

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Error detection of arithmetic circuits using a residue checker with signed-digit number system

Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dftvs.2001.966754 ◽

2002 ◽

Author(s):

Shugang Wei ◽

Kensuke Shimizu

Keyword(s):

Error Detection ◽

Number System ◽

Arithmetic Circuits ◽

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Built-in self-reconfiguring systems for fault tolerant mesh-connected processor arrays by direct spare replacement

Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dftvs.2001.966762 ◽

2002 ◽

Author(s):

I. Takanami

Keyword(s):

Fault Tolerant ◽

Processor Arrays

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Fast run-time fault location in dependable FPGA-based applications

Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dftvs.2001.966772 ◽

2002 ◽

Author(s):

Wei-Je Huang ◽

S. Mitra ◽

E.J. McCluskey

Keyword(s):

Fault Location ◽

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Challenges facing practical DFT for MEMS

Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dftvs.2001.966747 ◽

2002 ◽

Author(s):

S.K. Tewksbury

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Yield-reliability modeling for fault tolerant integrated circuits

Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dftvs.2001.966749 ◽

2002 ◽

Author(s):

T.S. Barnett ◽

A.D. Singh ◽

V.P. Nelson

Keyword(s):

Integrated Circuits ◽

Fault Tolerant ◽

Reliability Modeling

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Evaluation of clock distribution networks' most likely faults and produced effects

Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dftvs.2001.966789 ◽

2002 ◽

Author(s):

C. Metra ◽

S. Di Francescantonio ◽

T.M. Mak ◽

B. Ricco

Keyword(s):

Distribution Networks ◽

Clock Distribution ◽

Clock Distribution Networks

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Advanced fault-tolerance techniques for a color digital camera-on-a-chip

Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dftvs.2001.966746 ◽

2002 ◽

Author(s):

I. Koren ◽

G. Chapman ◽

Z. Koren

Keyword(s):

Fault Tolerance ◽

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Development of the special software tools for the defect/fault analysis in the complex gates from standard cell library

Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dftvs.2001.966791 ◽

2002 ◽

Author(s):

M. Blyzniuk ◽

I. Kazymyra

Keyword(s):

Software Tools ◽

Fault Analysis ◽

Standard Cell ◽

Standard Cell Library ◽

Cell Library ◽

Special Software

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