X-ray Diffraction Study on Lattice Constant of Supersaturated Solid Solution for Al Based Binary Alloys and Selected Al-Zn-Mg-Cu Alloys

2012 ◽  
pp. 1295-1300
Author(s):  
Zhihui Li ◽  
Baiqing Xiong ◽  
Yongan Zhang ◽  
Xiwu Li ◽  
Baohong Zhu ◽  
...  
Keyword(s):  
Solid Solution ◽  
Diffraction Study ◽  
Lattice Constant ◽  
Supersaturated Solid Solution ◽  
Binary Alloys ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cu Alloys

155Gd Mössbauer spectroscopic and powder X-ray diffraction study of CeO2–GdO1.5 solid solution

ICAME 2011 ◽  
2013 ◽  
pp. 503-507
Author(s):  
Akio Nakamura ◽  
Kazutaka Imai ◽  
Naoto Igawa ◽  
Yoshihiro Okamoto ◽  
Etsuji Yamamoto ◽  
...  
Keyword(s):  
Solid Solution ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray

Characterization of CdCrTe Layers Obtained by Pulsed Laser Deposition

2013 ◽  
Vol 203-204 ◽  
pp. 193-197
Author(s):  
Piotr Sagan ◽  
Volodymyr Popovych ◽  
Mariusz Bester ◽  
Marian Kuzma
Keyword(s):  
Solid Solution ◽  
Electron Diffraction ◽  
Lattice Constant ◽  
Pulse Length ◽  
Pulsed Laser ◽  
Thin Layers ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
X Ray

In this paper we have obtained CdCrTe thin layers by PLD method using the YAG:Nd3+ laser with pulse length 250μs. Synthesized CdCrTe solid solution with 50% at. of Cr has been taken as a target. The layers were deposited on KCl substrate. The target and films were analyzed using X-ray diffraction, TEM microscope and THEED electron diffraction. The morphology of the layers are homogenous. However, we have detected several crystallographic phases: cubic CdTe, hexagonal Cr and hexagonal Te. From the measurements of lattice constant of the layer, their composition was determined to be x=0,14

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